Office Online  
  Journal Online
    Current Issue
    Advanced Search
    Archive
    TOP Read
    TOP Download
Other articles related with "TN30":
3691 Wang Yanhao, Deng Erping, Wang Zuoyi, Li Daohui, Huang Yongzhang
  The Influence Mechanism of Humidity on the Chip Solder Layer Thermal Resistance of Power Semiconductor Devices
    Transactions of China Electrotechnical Society   2024 Vol.39 (12): 3691-3704 [Abstract] (55) [HTML 1 KB] [PDF 18521 KB] (128)
4947 Wang Laili, Zhao Cheng, Zhang Tongyu, Yan Feifei
  Review of Packaging Technology for Silicon Carbide Power Modules
    Transactions of China Electrotechnical Society   2023 Vol.38 (18): 4947-4962 [Abstract] (848) [HTML 1 KB] [PDF 14261 KB] (529)
2850 Peng Cheng, Li Xuebao, Fan Jiayu, Zhao Zhibin, Cui Xiang
  Effect of Stray Inductance Difference on Transient Current Distribution in Press-Pack IGBT Devices
    Transactions of China Electrotechnical Society   2023 Vol.38 (11): 2850-2860 [Abstract] (133) [HTML 1 KB] [PDF 9629 KB] (297)
4911 Shang Hai, Liang Lin, Wang Yijian, Yang Yingjie
  Weighted Optimization Design and Experimental Study of 6.5kV SiC MOSFET Module
    Transactions of China Electrotechnical Society   2022 Vol.37 (19): 4911-4922 [Abstract] (147) [HTML 1 KB] [PDF 27145 KB] (541)
4664 Zhao Fangwei, Li Yan, Wei Chao, Zhang Nan, Zheng Yanxuan
  Accurate Measurement of Dynamic on-Resistance of GaN Devices and Affecting Factor Analysis
    Transactions of China Electrotechnical Society   2022 Vol.37 (18): 4664-4675 [Abstract] (765) [HTML 1 KB] [PDF 2952 KB] (774)
2471 Peng Cheng, Li Xuebao, Zhang Guanrou, Zhao Zhibin, Cui Xiang
  Design and Implementation of an Experimental Platform for Dynamic Characteristics of Press-Pack IGBT Chip
    Transactions of China Electrotechnical Society   2021 Vol.36 (12): 2471-2481 [Abstract] (260) [HTML 1 KB] [PDF 10628 KB] (689)
3408 Zhou Jing, Kang Shengyang, Li Hui, Yao Ran, Li Jinyuan
  Simulation of Influence of Unbalanced Clamping Force on Electro-Thermal Characteristics of Press-Pack IGBT Devices
    Transactions of China Electrotechnical Society   2019 Vol.34 (16): 3408-3415 [Abstract] (221) [HTML 1 KB] [PDF 57699 KB] (814)
717 Wang Xuemei, Zhang Bo, Wu Haiping
  A Review of Fatigue Mechanism of Power Devices Based on Physics-of-Failure
    Transactions of China Electrotechnical Society   2019 Vol.34 (4): 717-727 [Abstract] (315) [HTML 1 KB] [PDF 49712 KB] (654)
4277 Zhang Jingwei, Deng Erping, Zhao Zhibin, Li Jinyuan, Huang Yongzhang
  Simulation on Fatigue Failure of Single IGBT Chip Module of Press-Pack IGBTs
    Transactions of China Electrotechnical Society   2018 Vol.33 (18): 4277-4285 [Abstract] (277) [HTML 1 KB] [PDF 47388 KB] (652)
4286 Wang Yueyue, Chen Minyou, Lai Wei, Chen Yigao, Luo Dan
  Healthy Condition Assessment on MOSFETs Based on External Characteristic Parameters and Adaptive Neuro-Fuzzy Inference System
    Transactions of China Electrotechnical Society   2018 Vol.33 (18): 4286-4294 [Abstract] (270) [HTML 1 KB] [PDF 46425 KB] (873)
1 Liu Binli, Luo Yifei, Xiao Fei, Wang Bo
  IGBT Thermal Model for Thermal Simulation of Device to System
    Transactions of China Electrotechnical Society   2017 Vol.32 (13): 1-13 [Abstract] (556) [HTML 1 KB] [PDF 48586 KB] (986)
201 Deng Erping, Zhao Zhibin, Zhang Peng, Huang Yongzhang, Lin Zhongkang
  Clamping Force Distribution within Press Pack IGBTs
    Transactions of China Electrotechnical Society   2017 Vol.32 (6): 201-208 [Abstract] (459) [HTML 1 KB] [PDF 507 KB] (1684)
63 He Junwei,Chen Sizhe,Ren Na,Bai Song,Tao Yonghong,Liu Ao,Sheng Kuang
  Fabrication and Testing of 4 500 V SiC SBD and JFET Power Modules
    Transactions of China Electrotechnical Society   2015 Vol.30 (17): 63-69 [Abstract] (419) [HTML 1 KB] [PDF 2166 KB] (972)
136 Zhang Jianxin, Niu Pingjuan, Wu Zhigang, Wang Jingxiang, Li Hongyue
  Two-Objective Optimization of Heat Sink Cooling Performance for High-Power LED Application
    Transactions of China Electrotechnical Society   2014 Vol.29 (4): 136-141 [Abstract] (696) [HTML 1 KB] [PDF 593 KB] (1912)
242 Zheng Libing, Han Li, Liu Jun, Wen Xuhui
  Investigation of the Temperature Character of IGBT Failure Mode Based on 3D Thermal-Electro Coupling FEM
    Transactions of China Electrotechnical Society   2011 Vol.26 (7): 242-246 [Abstract] (518) [HTML 0 KB] [PDF 555 KB] (2248)
100 Chen Mingbao
  Research on Theoretic Model & Its Package Types of the Bidirectional IGBT
    Transactions of China Electrotechnical Society   2009 Vol.24 (10): 100-105 [Abstract] (356) [HTML 1 KB] [PDF 489 KB] (2338)
43 Wang Laili, Zhao Cheng, Zhang Tongyu, Yan Feifei
  Review of Packaging Technology for Silicon Carbide Power Modules
    Transactions of China Electrotechnical Society   0 Vol. (): 43-43 [Abstract] (97) [HTML 1 KB] [PDF 4353 KB] (691)
230611 Wang Laili, Zhao Cheng, Zhang Tongyu, YanFeifei
  Review of Packaging and Integration Technology in Silicon Carbide Power modules
    Transactions of China Electrotechnical Society   0 Vol. (): 230611-230611 [Abstract] (38) [HTML 1 KB] [PDF 4311 KB] (291)
First page | Prev page | Next page | Last pagePage 1 of 1, 18 records
Copyright © Transactions of China Electrotechnical Society
Supported by: Beijing Magtech