Transactions of China Electrotechnical Society  2015, Vol. 30 Issue (17): 63-69    DOI:
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Fabrication and Testing of 4 500 V SiC SBD and JFET Power Modules
He Junwei1,Chen Sizhe1,Ren Na1,Bai Song2,Tao Yonghong2,Liu Ao2,Sheng Kuang1
1.College of Electrical Engineering Zhejiang University Hangzhou 310027 China
2.Nanjing Electronic Devices Institute Nanjing 210016 China

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Abstract  Based on self-developed SiC devices,this paper presents the fabrication and characterization of a 4 500 V/150 A SiC Schottky barrier diode (SBD) power module and a 4 500 V/50 A junction field effect transistor (JFET) power module.Additionally,with an appropriate gate drive circuit,the static and dynamic performances of both modules are also evaluated.The testing results indicate good current-conducting,voltage-blocking,and switching capabilities of the fabricated modules.This work demonstrates the highest power level of SiC power modules with self-fabricated chips in China.
Key wordsSiC      Schottky barrier diode      junction field effect transistor      power module     
Received: 22 December 2014      Published: 07 December 2015
PACS: TN30  
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He Junwei
Chen Sizhe
Ren Na
Bai Song
Tao Yonghong
Liu Ao
Sheng Kuang
Cite this article:   
He Junwei,Chen Sizhe,Ren Na等. Fabrication and Testing of 4 500 V SiC SBD and JFET Power Modules[J]. Transactions of China Electrotechnical Society, 2015, 30(17): 63-69.
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