电工技术学报  2016, Vol. 31 Issue (24): 173-180    DOI:
电力电子 |
老化实验条件下的IGBT寿命预测模型
赖伟1, 陈民铀1, 冉立1, 王学梅2, 徐盛友1
1. 输配电装备及系统安全与新技术国家重点实验室(重庆大学) 重庆 400044;
2. 华南理工大学电力学院 广州 510640
IGBT Lifetime Model Based on Aging Experiment
Lai Wei1, Chen Minyou1, Ran Li1, Wang Xuemei2, Xu Shengyou1
1. State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China;;
2. School of Electric Power South China University of Technology Guangzhou 510640 China
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摘要 以器件功率循环为基础,在疲劳损伤理论基础上建立功率器件寿命模型,以提高变流器的运行可靠性,为功率变流器的检修维护提供理论基础。给出了器件寿命预测模型的使用价值和意义,通过分析功率器件失效机理,设计了功率循环实验平台和老化实验方案,阐述了老化实验原理并给出了老化参数提取方法。利用Weibull分布建立了器件的一维寿命模型并分析了该模型的优缺点,提出了改进的器件三维寿命模型,通过对比、分析证明了该模型的准确性,得到的Arrhenius广延指数模型更能体现器件寿命分布。
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徐盛友
关键词 寿命模型功率循环Weibull分布Arrhenius广延指数模型IGBT    
Abstract:According to the IGBT power cycling test, the power device lifetime models based on the device fatigue damage theory are established, to reduce the maintenance cost, enhance the inverter reliability and provide the theoretical support for the inverter maintenance. Firstly, the ageing experiment theory and the extracting parameters method of the power devices were provided. Secondly, according to device fatigue damage theory, power cycling test platform was established and two test plans were designed to obtain the failure parameters of power module. Finally, the one-dimensional lifetime model using Weibull distribution was established. The advantages and disadvantages of this model were analyzed. Compared with the experimental results, the three-dimensional stretched exponential lifetime model is promoted, which is more reasonable than Coffin-Manson and Arrhenius models.
Key wordsLifetime    model,    power    cycling,    Weibull    distribution,    Arrhenius    stretched    exponential    model,    IGBT   
收稿日期: 2014-08-26      出版日期: 2017-01-03
PACS: TM46  
基金资助:国家自然科学基金(51477019),国家“111”计划(B08036),中央高校基本科研业务费(CDJZR12150074)和国家重点基础研究发展计划(973计划)(2012CB25200)资助项目
作者简介: 赖 伟 男,1986年生,博士,研究方向为电力电子器件可靠性和状态监测。E-mail: laiweicqu@126.com(通信作者);陈民铀 男,1954年生,教授,博士生导师,研究方向为在线监测与故障诊断。E-mail: mchencqu@126.com
引用本文:   
赖伟, 陈民铀, 冉立, 王学梅, 徐盛友. 老化实验条件下的IGBT寿命预测模型[J]. 电工技术学报, 2016, 31(24): 173-180. Lai Wei, Chen Minyou, Ran Li, Wang Xuemei, Xu Shengyou. IGBT Lifetime Model Based on Aging Experiment. Transactions of China Electrotechnical Society, 2016, 31(24): 173-180.
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