Lai Wei1, Chen Minyou1, Ran Li1, Wang Xuemei2, Xu Shengyou1
1. State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China;; 2. School of Electric Power South China University of Technology Guangzhou 510640 China
Abstract：According to the IGBT power cycling test, the power device lifetime models based on the device fatigue damage theory are established, to reduce the maintenance cost, enhance the inverter reliability and provide the theoretical support for the inverter maintenance. Firstly, the ageing experiment theory and the extracting parameters method of the power devices were provided. Secondly, according to device fatigue damage theory, power cycling test platform was established and two test plans were designed to obtain the failure parameters of power module. Finally, the one-dimensional lifetime model using Weibull distribution was established. The advantages and disadvantages of this model were analyzed. Compared with the experimental results, the three-dimensional stretched exponential lifetime model is promoted, which is more reasonable than Coffin-Manson and Arrhenius models.
赖伟, 陈民铀, 冉立, 王学梅, 徐盛友. 老化实验条件下的IGBT寿命预测模型[J]. 电工技术学报, 2016, 31(24): 173-180.
Lai Wei, Chen Minyou, Ran Li, Wang Xuemei, Xu Shengyou. IGBT Lifetime Model Based on Aging Experiment. Transactions of China Electrotechnical Society, 2016, 31(24): 173-180.
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2016, Vol. 31 
