电工技术学报  2022, Vol. 37 Issue (12): 3038-3047    DOI: 10.19595/j.cnki.1000-6753.tces.211003
电力电子 |
恒流驱动下基于VeE_max的IGBT模块解耦老化影响的结温测量方法
杨舒萌1,2, 孙鹏菊1, 王凯宏1, 王绪龙1, 黄旭1
1.输配电装备及系统安全与新技术国家重点实验室(重庆大学) 重庆 400044;
2.株洲中车时代半导体有限公司 株洲 412001
Junction Temperature Measurement Method of IGBT Modules Based on VeE-max Under Constant-Current Source Drive Which Decouples Fatigue Effect
Yang Shumeng1,2, Sun Pengju1, Wang Kaihong1, Wang Xulong1, Huang Xu1
1. State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China;
2. Zhuzhou CRRC Times Semiconductor Co. Ltd Zhuzhou 412001 China
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摘要 绝缘栅双极型晶体管(IGBT)的结温在线测量对于电力电子装置的安全可靠运行、延长使用寿命和热管理等都具有重要意义。然而,目前大多数温敏电参数均受IGBT模块疲劳老化的影响。为此,该文提出一种恒流驱动下基于感应电压峰值VeE_max的IGBT模块结温在线测量方法,该方法能够解耦键合线老化对温敏电参数的影响。基于双脉冲实验平台分析VeE_max的温线性度和温敏感度,并通过模拟键合线老化实验验证所提方法的老化解耦性。最后,通过Buck变换器验证该方法在运行变流器中在线结温测量的可行性。
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杨舒萌
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关键词 绝缘栅双极型晶体管(IGBT)温敏电参数解耦老化影响结温在线测量    
Abstract:Online junction temperature measurement of insulated gate bipolar transistors (IGBTs) is of great significance for safe and reliable operation, prolonging service life and thermal management of power electronic devices. However, most of the temperature sensitive electrical parameters (TSEPs) are coupled with the fatigue of IGBT modules. Therefore, this paper proposed a junction temperature measurement method based on the peak value of induced voltage VeE_max under constant current source, which decouples the influence of the bond wire fatigue. This paper analyzed the temperature linearity and temperature sensitivity of VeE_max based on dual pulse experimental platform, then verified the fatigue decoupling function of proposed method by simulating the bond wire fatigue. Finally, the feasibility of online junction temperature measurement is verified by Buck converter.
Key wordsInsulated gate bipolar transistor(IGBT)    temp-sensitive electrical parameter    decouple fatigue effect    online junction temperature measurement   
收稿日期: 2021-07-07     
PACS: TM46  
基金资助:广东省重点领域研发计划资助项目(2020B010173001)
通讯作者: 孙鹏菊 女,1982年生,教授,博士生导师,研究方向为并网逆变器稳定性分析、功率半导体可靠性等。E-mail: spengju@cqu.edu.cn   
作者简介: 杨舒萌 男,1996年生,硕士研究生,研究方向为功率半导体可靠性。E-mail: 530343572@qq.com
引用本文:   
杨舒萌, 孙鹏菊, 王凯宏, 王绪龙, 黄旭. 恒流驱动下基于VeE_max的IGBT模块解耦老化影响的结温测量方法[J]. 电工技术学报, 2022, 37(12): 3038-3047. Yang Shumeng, Sun Pengju, Wang Kaihong, Wang Xulong, Huang Xu. Junction Temperature Measurement Method of IGBT Modules Based on VeE-max Under Constant-Current Source Drive Which Decouples Fatigue Effect. Transactions of China Electrotechnical Society, 2022, 37(12): 3038-3047.
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