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Other articles related with "TN322":
1074
Ren Hongyu, Yu Yaoyi, Du Xiong, Liu Junliang, Zhou Junjie
IGBT Lifetime Prediction Model Based on Optimized Long Short-Term Memory Neural Network
Transactions of China Electrotechnical Society 2024 Vol.39 (4): 1074-1086 [
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44
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1979 KB] (
333
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131
Ren Hongyu, Yu Yaoyi, Du Xiong, Liu Junliang, Zhou Junjie
IGBT Lifetime Prediction Model Based on Optimized Long Short-Term Memory Neural Network
Transactions of China Electrotechnical Society 0 Vol. (): 131-131 [
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93
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903 KB] (
383
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3845
Zhang Yubin, Wen Yingke, Ruan Lin
Research on Electrothermal Coupling Model of Fully-Immersed Evaporative Cooling IGBT
Transactions of China Electrotechnical Society 2022 Vol.37 (15): 3845-3856 [
Abstract
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154
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1 KB] [
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4661 KB] (
959
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244
Zhao Zixuan, Chen Jie, Deng Erping, Li Anqi, Huang Yongzhang
The Influence and Failure Mechanism Analysis of the Load Current on the IGBT Lifetime with Bond Wire Failure
Transactions of China Electrotechnical Society 2022 Vol.37 (1): 244-253 [
Abstract
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202
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1 KB] [
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6555 KB] (
1005
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1952
Jia Yingjie, Xiao Fei, Luo Yifei, Liu Binli, Huang Yongle
Multi-Rate Electro-Thermal Simulation Method for High Power IGBT Based on Field-Circuit Coupling
Transactions of China Electrotechnical Society 2020 Vol.35 (9): 1952-1961 [
Abstract
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434
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1 KB] [
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32847 KB] (
640
)
310
Jia Yingjie, Luo Yifei, Xiao Fei, Liu Binli, Huang Yongle
An Equivalent Electrical Resistance Model of IGBT Suitable for Ohm’s Law
Transactions of China Electrotechnical Society 2020 Vol.35 (2): 310-317 [
Abstract
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193
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1 KB] [
PDF
43095 KB] (
680
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183
Liu Binli, Xiao Fei, Luo Yifei, Wang Bo, Xiong Youxing
Investigation into the Health Condition Monitoring Method of IGBT Based on Collector Leakage Current
Transactions of China Electrotechnical Society 2017 Vol.32 (16): 183-193 [
Abstract
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528
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1 KB] [
PDF
582 KB] (
1675
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50
Wang Bo, Luo Yifei, Liu Binli, Pu Jing
Transient Mathematical Model of Trench Field-Stop IGBT
Transactions of China Electrotechnical Society 2017 Vol.32 (12): 50-57 [
Abstract
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469
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18381 KB] (
804
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79
Liu Binli, Luo Yifei, Xiao Fei, Xiong Youxing, Jia Yingjie
Junction Temperature Prediction Mathematical Model of IGBT Based on the Characteristics of Thermal Dynamics
Transactions of China Electrotechnical Society 2017 Vol.32 (12): 79-87 [
Abstract
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433
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1 KB] [
PDF
18334 KB] (
956
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135
Wang Bo, Luo Yifei, Zhang Shuo, Liu Binli
Analysis of Limiting Power Dissipation and Thermal Failure Mechanism
Transactions of China Electrotechnical Society 2016 Vol.31 (12): 135-141 [
Abstract
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468
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HTML
1 KB] [
PDF
0 KB] (
191
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146
Tang Yong, Wang Bo, Chen Ming
Temperature Characteristioc and Electric-Thermal Model of IGBT Switching Transient
Transactions of China Electrotechnical Society 2012 Vol.27 (12): 146-153 [
Abstract
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615
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HTML
1 KB] [
PDF
712 KB] (
2273
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145
Wang Bo, Hu An, Tang Yong, Chen Ming
Analysis of Voltage Breakdown Characteristic of IGBT
Transactions of China Electrotechnical Society 2011 Vol.26 (8): 145-150 [
Abstract
] (
866
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1 KB] [
PDF
666 KB] (
3740
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