Healthy Condition Assessment on MOSFETs Based on External Characteristic Parameters and Adaptive Neuro-Fuzzy Inference System
Wang Yueyue1, 2, Chen Minyou1, Lai Wei1, Chen Yigao3, Luo Dan1
1. State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China; 2. State Grid Chengdu Qingbaijiang Electric Power Supply Branch Chengdu 610300 China; 3. Chongqing Vehicle Test amp Research Institute Co. Ltd Chongqing 401122 China
Abstract:Solder delamination is one of the main failure modes of power modules. An accurate method to assess its healthy condition is particularly important for improving system reliability. This paper focuses on MOSFET modules, which are widely used in the power electronic system. Under a certain driving voltage condition, a healthy assessment model is proposed based on the on-state resistance, case temperature and current. First, an electrical-thermal coupling model is established to discuss the electrical and thermal characteristics of MOSFET under different delamination degrees of the solder layer. Then, the sensitivities of different characteristic parameters to solder delamination are investigated under different conditions. It indicates that, under the same operating conditions, the increment of the on-state resistance has a higher sensitivity. Finally, the external characteristic parameters are introduced to represent the working condition, such as case temperature, on-state resistance and current. Based on the adaptive neuro-fuzzy inference system (ANFIS), a healthy assessment model is built to predict module aging rate and classify the healthy condition grade interval. This method is easy to monitor data extraction and has high precision, which can provide guidance to rational use of modules, condition-based maintenance and other practical applications.
王月月, 陈民铀, 赖伟, 陈一高, 罗丹. 基于MOSFET外特性参量的自适应模糊神经网络状态评估模型[J]. 电工技术学报, 2018, 33(18): 4286-4294.
Wang Yueyue, Chen Minyou, Lai Wei, Chen Yigao, Luo Dan. Healthy Condition Assessment on MOSFETs Based on External Characteristic Parameters and Adaptive Neuro-Fuzzy Inference System. Transactions of China Electrotechnical Society, 2018, 33(18): 4286-4294.
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