Abstract：This paper presents a modified Y source inverter (M-YSI), which owns better input current performance and low DC-link voltage spike by optimal topology. Taken SiC MOSFETs as an example, the reliability analysis process and method are provided in detail. This process builds the electro-thermal coupling model of switches based on the device parameters and analyzes the thermal behavior of the switches in the inverter bridge of the M-YSI. The thermal loading of switches based on the mission profile is obtained through the look-up table method. The life prediction of switches is realized by considering lifetime model and Miner rules. Finally, Monte Carlo analysis and Weibull fitting are used to complete the reliability analysis. The research content can provide reference for reliability analysis of similar circuits.
姚婷婷, 管乐诗, 石恩达, 王卫, 徐殿国. 一种低母线电压尖峰的改进型Y源逆变器及其可靠性分析[J]. 电工技术学报, 2021, 36(zk1): 209-217.
Yao Tingting, Guan Yueshi, Shi Enda, Wang Wei, Xu Dianguo. A Low DC-Link Voltage Spike Modified Y-Source Inverter and Its Reliability Evaluation. Transactions of China Electrotechnical Society, 2021, 36(zk1): 209-217.
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