稳定型氧化锌压敏电阻高温直流老化的转变特性

doi:10.19595/j.cnki.1000-6753.tces.240759

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摘要金属氧化物避雷器是电力系统过电压保护的核心装置,决定了电力设备的绝缘水平,其核心为氧化锌压敏电阻。现代稳定型氧化锌压敏电阻的直流老化功耗反常下降,难以对其进行有效的状态评估和寿命预测,其老化机制研究已成为限制其未来发展的巨大挑战。该文对稳定型氧化锌压敏电阻在不同温度下进行加速直流老化,研究高温下其直流老化特性的转变。结果表明,随着老化温度升高,稳定型氧化锌压敏电阻的功耗由120℃下的持续下降转变为150℃下的先降后升,而后在180℃下持续上升。150℃下转变为介稳型后,老化不再可逆。原位高温介电测试表明,晶界界面空间电荷极化松弛过程向高频移动,松弛时间缩短,活化能减小;低温介电测试中本征点缺陷锌填隙在老化后出现不可逆消耗。180℃下转变为不稳定型后,正向伏安特性的“交叉”现象消失,电气性能显著劣化。离线理化结构测试发现,氧化锌晶面衍射角减小、峰强下降,晶格之间的间距增加,Zn_2p轨道峰结合能明显下降,锌填隙被还原,证实了晶界界面态在高温下难以维持稳定,将与锌填隙中和并被消耗。以上研究结果可为稳定型氧化锌压敏电阻反常老化的微观机制研究及其稳定性调控提供支撑。

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关键词 ：氧化锌, 压敏电阻, 直流老化, 避雷器, 长期稳定性

Abstract：Metal oxide surge arresters are crucial for overvoltage protection in power systems, determining the insulation level of electrical equipment, with their core component being the ZnO varistor. However, modern stable ZnO varistors exhibit an anomalous decrease in power loss during aging, contradicting the increase in power loss predicted by the classical ion migration model. This discrepancy poses challenges for the condition assessment and life prediction of ZnO varistors due to a lack of theoretical foundations, thereby presenting a potential threat to the power system. Consequently, the study of the anomalous aging mechanism of stable ZnO varistors has been identified as a major challenge for the varistor community by CIGRE in both 2013 and 2017.
In this paper, stable ZnO varistors are subjected to accelerated DC aging at elevated aging temperatures to investigate their long-term stability transition. With increase in aging temperature, power loss trend transitions from a continuous decrease at 120℃ to an initial decrease followed by an increase at 150℃, and a sustained rise at 180℃. The decreasing power loss trend can be fitted by a double exponential decay function, while the increasing power loss is proportional to the square root of the aging time t^0.5. After transitioning to a mixed stable type at 150℃, the aging of stable ZnO varistors becomes irreversible. In-situ high-temperature dielectric measurements reveal that the interface space charge polarization relaxation process shifts to higher frequencies with decreased relaxation time and activation energy decreasing from 0.583 eV to 0.560 eV, indicating the destruction of the grain boundary structure. Low-temperature dielectric tests show that intrinsic point defects of zinc interstitials undergo irreversible consumption after aging. Upon transitioning to an instable type at 180℃, the "crossover" phenomenon of the forward current-voltage (I-U) characteristics disappears at 180℃, and both forward and reverse I-V characteristics shift towards increased leakage current region as a whole. Severe deterioration in reverse electrical parameters was observed, as breakdown voltage U_1mA decreases from 200.5 V to 92.9 V, the nonlinear coefficient α decreases from 16.3 to 2.0, and the leakage current rises from 19.5 μA to 479.3 μA. More importantly, offline physical and chemical structural tests show a reduction in the diffraction angles of ZnO crystal planes and decreased peak intensities. Additionally, a significant decrease in the binding energy of the Zn_2p orbital is observed, with Zn_2p3/2 and Zn_2p1/2 orbitals decreasing from 1 022.5 eV and 1 045.9 eV to 1 022.1 eV and 1 045.2 eV, respectively. This indicates the reduction of zinc interstitials and confirming that the interface states cannot maintain stability at high temperatures, thus becoming neutralized and consumed with zinc interstitials.
These findings demonstrate that the essence of the decreasing power loss in stable ZnO varistors lies in the stable interface states at the grain boundary, which, however, cannot maintain stable at certain high temperatures. The interface states would then neutralize with the zinc interstitials due ion migration, subsequently leading to the reduction of zinc interstitials and the destruction of the ZnO lattice, resulting in significant deterioration of ZnO varistors. Therefore, optimizing the high-temperature stability of the interface states is crucial for enhancing the long-term stability of ZnO varistors.

Key words： ZnO varistors DC aging arrester long-term stability

收稿日期: 2024-05-12

PACS:	TM286
	TM862

基金资助:国家自然科学基金（52107027, 51937008, 52207022）、中国博士后基金（2022M722513）和电力设备电气绝缘国家重点实验室中青年基金（EIPE22310）资助项目

通讯作者: 李建英男,1972年生,教授,博士生导师,研究方向为电介质理论及其应用、先进电工材料等。E-mail：lijy@xjtu.edu.cn

作者简介: 程卓林男,1997年生,博士研究生,研究方向为稳定型氧化锌压敏陶瓷的直流老化机制。E-mail：czlxjt@stu.xjtu.edu.cn

引用本文:

程卓林, 武康宁, 王佳乐, 高傲, 唐壮, 李建英. 稳定型氧化锌压敏电阻高温直流老化的转变特性[J]. 电工技术学报, 2025, 40(9): 2958-2969. Cheng Zhuolin, Wu Kangning, Wang Jiale, Gao Ao, Tang Zhuang, Li Jianying. Transition Characteristics of Stable ZnO Varistors During DC Aging at High Temperatures. Transactions of China Electrotechnical Society, 2025, 40(9): 2958-2969.

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