Office Online
Author Center
Peer Review
Editor Work
Journal Online
Current Issue
Advanced Search
Archive
TOP Read
TOP Download
Other articles related with "TN322.8":
1074
Ren Hongyu, Yu Yaoyi, Du Xiong, Liu Junliang, Zhou Junjie
IGBT Lifetime Prediction Model Based on Optimized Long Short-Term Memory Neural Network
Transactions of China Electrotechnical Society 2024 Vol.39 (4): 1074-1086 [
Abstract
] (
66
) [
HTML
1 KB] [
PDF
1979 KB] (
473
)
131
Ren Hongyu, Yu Yaoyi, Du Xiong, Liu Junliang, Zhou Junjie
IGBT Lifetime Prediction Model Based on Optimized Long Short-Term Memory Neural Network
Transactions of China Electrotechnical Society 0 Vol. (): 131-131 [
Abstract
] (
98
) [
HTML
1 KB] [
PDF
903 KB] (
406
)
3845
Zhang Yubin, Wen Yingke, Ruan Lin
Research on Electrothermal Coupling Model of Fully-Immersed Evaporative Cooling IGBT
Transactions of China Electrotechnical Society 2022 Vol.37 (15): 3845-3856 [
Abstract
] (
186
) [
HTML
1 KB] [
PDF
4661 KB] (
1035
)
244
Zhao Zixuan, Chen Jie, Deng Erping, Li Anqi, Huang Yongzhang
The Influence and Failure Mechanism Analysis of the Load Current on the IGBT Lifetime with Bond Wire Failure
Transactions of China Electrotechnical Society 2022 Vol.37 (1): 244-253 [
Abstract
] (
252
) [
HTML
1 KB] [
PDF
6555 KB] (
1104
)
First page | Prev page | Next page | Last page
Page 1 of 1, 4 records
Copyright © Transactions of China Electrotechnical Society
Supported by: Beijing Magtech
