HF和H<sub>2</sub>S作为气体绝缘组合电器绝缘缺陷诊断特征气体的有效性

doi:10.19595/j.cnki.1000-6753.tces.160303

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摘要

局部放电特征气体监测是实现气体绝缘组合电器(GIS)缺陷预警的重要依据和手段。为探索潜在特征气体HF和H₂S与放电类型和程度的关联,在模拟试验平台上设置金属尖端放电、自由金属颗粒放电、气隙放电和沿面放电等四种典型放电模型。首次重点关注不同放电缺陷下HF和H₂S的变化规律,并在此基础上研究5A、F-03、KDHF-03等三种典型分子筛吸附剂对两种分解产物变化规律的影响。试验结果表明,HF和H₂S是GIS内两种重要的放电特征气体,其中HF可有效反映强局部放电,H₂S可用于表征较严重的涉及盆式绝缘子等环氧树脂固体介质放电;HF和H₂S活泼的化学性质和吸附剂对二者较强的吸附作用,决定了HF和H₂S特征气体难以在GIS气室内长期稳定存在。因此,开展HF和H₂S在线检测技术研究及应用对利用化学诊断法准确评估GIS的绝缘状态具有重要意义。

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Abstract：

Target gas monitoring of partial discharge(PD)is an important basis and means to achieve defect warning of gas insulated switchgear(GIS).To explore the relationship between the potential target gases of HF and H₂S and PD in GIS,four typical PD patterns were set up on experiment platform,studying the variation of decomposition products HF and H₂S under different kinds of discharge.On the basis,the effect of three typical molecular sieve adsorbents was also considered.Experiments results showed that HF and H₂S were two important target gases of PD in GIS,HF to reflect strong PD,and H₂S to characterize serious solid dielectrics discharge of epoxy resin such as basin-type insulator.Because of the chemical properties of the two gases and the strong adsorption of molecular sieve adsorbents,the target gases of HF and H₂S are difficult to long-term stabilize in GIS.Therefore,the research and application of HF and H₂S on-line monitoring technology will be of great significance to accurately assess the insulation state of GIS by chemical diagnosis method.

Key words： Gas insulated switchgear target gas HF H₂S adsorption

收稿日期: 2016-03-14 出版日期: 2017-10-25

PACS:

TM855

作者简介: 唐念男,1983年生,博士,高级工程师,研究方向为SF₆电气设备潜伏性缺陷诊断和电力环境保护。E-mail:tangnian_2005@163.com(通信作者)乔胜亚男,1991年生,硕士,研究方向为SF₆电气设备潜伏性缺陷诊断。E-mail:shyqiao@whu.edu.cn

引用本文:

唐念,乔胜亚,李丽,樊小鹏,周文俊. HF和H₂S作为气体绝缘组合电器绝缘缺陷诊断特征气体的有效性[J]. 电工技术学报, 2017, 32(19): 202-211. Tang Nian, Qiao Shengya, Li Li, Fan Xiaopeng, Zhou Wenjun. Validity of HF and H₂S as Target Gases of Insulation Monitoring in Gas Insulated Switchgear. Transactions of China Electrotechnical Society, 2017, 32(19): 202-211.

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https://dgjsxb.ces-transaction.com/CN/10.19595/j.cnki.1000-6753.tces.160303 https://dgjsxb.ces-transaction.com/CN/Y2017/V32/I19/202

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