Abstract：For high-reliability, long-life electronic leakage circuit breakers, a residual life prediction model based on Wiener process is established to predict its reliability. First, the constant stress accelerated degradation test is carried out for the electronic leakage circuit breaker, with temperature as the accelerated stress and residual operating current as the degradation characteristic quantity. According to test data, its performance degradation trajectory is described, and the performance degradation rules are analyzed. Then, the test data of the accelerated degradation are checked by normal distribution to verify that it conforms to the Wiener process. The maximum likelihood estimation method is used to estimate the parameters of the residual life prediction model and predict the residual life of the leakage circuit breaker. Taking the remaining life of the circuit breaker at the initial moment as the pseudo-failure life, it is extrapolated that the life under normal stress is about 2 085 days.
刘帼巾, 李想, 王泽, 岳承浩. 基于Wiener过程电子式漏电断路器的剩余寿命预测[J]. 电工技术学报, 2022, 37(2): 528-536.
Liu Guojin, Li Xiang, Wang Ze, Yue Chenghao. Remaining Life Prediction of Electronic Residual Current Circuit Breaker Based on Wiener Process. Transactions of China Electrotechnical Society, 2022, 37(2): 528-536.
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