基于改进时变电弧方程的直流覆冰闪络动态电路模型研究

doi:10.19595/j.cnki.1000-6753.tces.171391

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摘要覆冰闪络的动态电路模型可用于模拟冰闪发展的动态变化过程,有助于深入探究覆冰绝缘子闪络发展的机理。针对现有动态模型中的时变电弧方程仅表征电弧在空气间隙发展的不足,充分考虑冰层表面对电弧发展的影响,对时变电弧方程进行改进,使其能够更加准确地描述实际冰闪电弧的动态变化。在此基础上,建立直流覆冰闪络的动态电路模型,将模型仿真结果与已有模型进行对比,同时在人工气候室内对等效玻璃平板进行覆冰闪络的试验验证。结果表明：建立的动态电路模型所预测的闪络电压值更接近试验值,两者最大相对误差为6.6%;预测泄漏电流与实测泄漏电流的动态变化规律具有较好的一致性。

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关键词 ：覆冰闪络, 动态电路模型, 电弧方程, 泄漏电流, 闪络电压

Abstract：The dynamic circuit model of icing flashover can be used for simulating the dynamic process of icing flashover, which contributes to further study of the flashover mechanism of ice-covered insulators. However, the arc equation used by existing models only describe the arc propagation in the air gap. In this paper, the influence of ice surface on the arc propagation is taken into account to improve the time-varying arc equation. Therefore, the dynamic changes of actual icing flashover arc can be described more accurately. On this basis, the dynamic circuit model of DC icing flashover is proposed. Furthermore, the simulation results of the model are compared with other existing models and icing flashover tests of equivalent glass plane are then carried out in artificial climate chamber. The results show that the flashover voltage forecasted by the improved model in this paper is closer to the test value and the maximum relative error is 6.6%. The dynamic process of simulated leakage current has a good consistency with the measured leakage current.

Key words： Icing flashover dynamic circuit model arc equation leakage current flashover voltage

收稿日期: 2017-04-20 出版日期: 2018-10-15

PACS:

TM85

基金资助:国家自然科学基金（51637002,51321063）和国家电网公司项目（52182017000X）资助

作者简介: 舒立春男,1964年生,博士,教授,研究方向为高电压与绝缘技术、输电线路覆冰及防护。E-mail：lcshu@cqu.edu.cn;王鹏浩男,1992年生,硕士研究生,研究方向为覆冰绝缘子直流闪络模型。E-mail：wangpenghao23@foxmail.com（通信作者）

引用本文:

舒立春, 王鹏浩, 徐宁, 蒋兴良, 胡琴. 基于改进时变电弧方程的直流覆冰闪络动态电路模型研究[J]. 电工技术学报, 2018, 33(19): 4603-4610. Shu Lichun, Wang Penghao, Xu Ning, Jiang Xingliang, Hu Qin. Study on Dynamic Circuit Model of DC Icing Flashover Based on Improved Time-Varying Arc Equation. Transactions of China Electrotechnical Society, 2018, 33(19): 4603-4610.

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https://dgjsxb.ces-transaction.com/CN/10.19595/j.cnki.1000-6753.tces.171391 https://dgjsxb.ces-transaction.com/CN/Y2018/V33/I19/4603

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