Impact of Linear Metal Particle on Surface Charge Accumulation of Post Insulator Within DC GIL
Wang Jian1, Li Botao2, Li Qingmin1, Liu Sihua1, Ma Guoming1
1.State Key Lab of Alternate Electrical Power System with Renewable Energy Sources North China Electric Power University Beijing 102206 China 2.State Grid Rizhao Power Supply Company Rizhao 276826 China
Abstract：The paper aims to study the conductive particles’ effects on surface charge accumulation of the post insulator within DC GIL.Based on the Maxwell equations,the surface charge accumulation along the post-insulator is analyzed.Also,the particle pollution,as well as the rates of generating,recombination,migration,and diffusion of the positive and negative ions in the gas are taken into account.Further,from the microcosmic perspective,two surface charge accumulation models of the post-insulator with particle pollution are established.Based on these models,the impacts of both the attached particles and the suspended particles on charge accumulation are explored by COMSOL respectively.The effectiveness and correctness of the simulations are verified through the comparison of the experimental results and the ones provided by previous researchers.The results illustrate that,the accumulation of the surface charge surge may be caused by the conductive particles attached to the surface of the insulator.In addition,the surge caused by the particles attached to the middle part is more remarkable.The polarities at both ends of the particles are opposite to each other as well as to the electrodes they approach.The impacts of the floating particles on the surface charge accumulation can be neglected if the distance between the suspended particle and the insulator surface is more than 4 times of the particle diameter.
王健, 李伯涛, 李庆民, 刘思华, 马国明. 直流GIL中线形金属微粒对柱式绝缘子表面电荷积聚的影响[J]. 电工技术学报, 2016, 31(15): 213-222.
Wang Jian, Li Botao, Li Qingmin, Liu Sihua, Ma Guoming. Impact of Linear Metal Particle on Surface Charge Accumulation of Post Insulator Within DC GIL. Transactions of China Electrotechnical Society, 2016, 31(15): 213-222.
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