电工技术学报  2024, Vol. 39 Issue (17): 5545-5554    DOI: 10.19595/j.cnki.1000-6753.tces.231031
高电压与放电 |
基于硅橡胶分子链陷阱变化的复合绝缘子老化现象
沈瑶1, 刘兴杰1, 梁英1, 薄天利1, 赵涛2
1.宁夏大学电子与电气工程学院 银川 750021;
2.华北电力大学电力工程系 保定 071003
Aging Phenomenon of Composite Insulators Based on Chemical Traps' Change of Silicone Rubber Molecular Chain
Shen Yao1, Liu Xingjie1, Liang Ying1, Bo Tianli1, Zhao Tao2
1. School of Electronic and Electrical Engineering Ningxia University Yinchuan 750021 China;
2. Department of Electric Power Engineering North China Electric Power University Baoding 071003 China