接触器触点超程分析及其退化状态的诊断

doi:10.19595/j.cnki.1000-6753.tces.181834

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摘要触点超程是表征接触器寿命的重要特征参数。目前无法在接触器工作时直接测量得到触点超程,主要通过超程时间进行接触器寿命预测研究,而此类方法存在试验周期长、推广性差、数据噪声大等问题。该文首先在寿命试验数据基础上,分析触点超程与寿命之间的关系,确定触点超程的退化机理及退化范围;然后基于虚拟样机仿真模拟触点超程退化过程,分析触点超程退化特征,提取退化特征值;基于实际产品寿命试验触点超程的退化数据,提出利用支持向量机对触点超程退化等级进行分类的方法,完成对触点超程退化状态的诊断;最后通过实例验证诊断方法的可行性,诊断结果表明该方法具有较高的准确率,可大大缩短接触器寿命预测所需要的时间。

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	韦震

关键词 ：接触器, 寿命, 触点超程, 支持向量机

Abstract：Contact overtravel is an important characteristic parameter that characterizes the life of a contactor. At present, it is impossible to measure the contact overtravel directly when the contactor is working. A lot of scholars have predicted the life of electrical apparatus on overtravel time. The life prediction of the contactor is mainly based on the overtravel time. However, such methods have many problems, such as long test period, poor generalization and large data noise. Firstly, on the basis of life test data, the relationship between contact overtravel and life is analyzed to determine the degradation mechanism and degradation range of contact overtravel. Secondly, based on virtual prototype simulation, contact overtravel degradation characteristics are analyzed and degradation feature are extracted. Based on the degradation data of contact overtravel in actual product life test, support vector machine is proposed to classify the degradation. Finally, the feasibility of the diagnosis method is verified by an example. The diagnosis results show that the method has high accuracy and can greatly shorten the time required for life prediction of contactors.

Key words： Switch apparatus life contact overtravel support vector machine

收稿日期: 2018-11-29 出版日期: 2020-01-17

PACS:

TM52

基金资助:中国博士后科学基金（2016M591530）和国家自然科学基金（51507033）资助项目

通讯作者: 梁慧敏女,1972年生,教授,博士生导师,研究方向为电器可靠性设计技术及电弧与电接触理论。E-mail：hitra@hit.edu.cn

作者简介: 付饶男,1993年生,博士研究生,研究方向为电器可靠性设计技术。E-mail：yc_furao@163.com

引用本文:

付饶, 梁慧敏, 叶雪荣, 由佳欣, 韦震. 接触器触点超程分析及其退化状态的诊断[J]. 电工技术学报, 2020, 35(1): 125-133. Fu Rao, Liang Huimin, Ye Xuerong, You Jiaxin, Wei Zhen. Analysis of the Contact Overtravel of Contactor and Its Degradation State Evaluation. Transactions of China Electrotechnical Society, 2020, 35(1): 125-133.

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https://dgjsxb.ces-transaction.com/CN/10.19595/j.cnki.1000-6753.tces.181834 https://dgjsxb.ces-transaction.com/CN/Y2020/V35/I1/125

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