真空断路器CuCr触头材料烧蚀动力学仿真与掺杂设计

doi:10.19595/j.cnki.1000-6753.tces.251116

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摘要随着真空断路器向高电压、大电流方向发展,传统CuCr触头材料的耐烧蚀性能已难以满足严苛工况的需求,成为制约真空断路器技术发展的关键技术瓶颈。该文基于真空电弧烧蚀特性,构建了触头材料电弧烧蚀微观动力学模型,并以烧蚀质量作为触头材料耐烧蚀性能的表征参数,提出一种耐烧蚀触头材料掺杂设计的新方法。通过对60种Mo/W掺杂CuCr触头材料的电弧烧蚀模拟,筛选出耐烧蚀性能最优的Cu₄₇Cr₅₀W₃触头材料,并发现Cu原子百分比为70%~80%的CuCr合金展现出最强的耐烧蚀性能掺杂强化潜力。同时,基于第一性原理计算并表征了触头材料的非热力学宏观静态物性参数。在筛选出的耐烧蚀掺杂合金中,Cu₈₇Cr₁₀Mo₃、Cu₈₀Cr₁₈Mo₂和Cu₆₇Cr₃₀W₃的抗形变能力、抗熔焊性能及硬度等均优于其基体合金,其中Cu₆₇Cr₃₀W₃的部分力学性能已与CuCr₄₀和CuCr₅₀相当。然而,Mo和W的加入减少了-10~0 eV之间可参与导电的价带电子数,使得合金的导电性能仍主要受Cu含量的调控。综合考虑耐烧蚀性能、力学性能与电性能,Cu原子百分比为70%~80%的CuCr掺杂合金展现出优异的综合性能,这一范围内的合金体系应成为未来高性能触头材料研究的重点。

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	冯大伟
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关键词 ：真空断路器, CuCr合金, 耐烧蚀性能, 分子动力学, 第一性原理

Abstract：With the development of power system toward high voltage and large current, vacuum circuit breakers, as environmentally friendly control and protection devices, play a vital role in ensuring power transmission safety and improving the reliability of electrical energy delivery. The ablation resistance of traditional CuCr contact materials has become insufficient to meet the demand of severe working conditions. This limitation has emerged as a critical bottleneck restricting the advancement of vacuum circuit breakers. To address this challenge, this dissertation systematically investigates the ablation mechanism and doping-enhanced effects of CuCr contact materials based on the microscopic dynamic simulations of arc ablation on contacts. Furthermore, the non-thermodynamic macroscopic physical parameters of the contact materials are characterized by first principles calculations. Based on the above, a new doping-enhanced design method for ablation-resistant contact materials is proposed to provide theoretical basis and methodological guidance for the development of high-performance contact materials.
Firstly, a microscopic dynamic model of arc ablation was constructed. Crystal models of five CuCr alloys with Cr atom contents ranging from 10% to 50% were generated by using the special quasi-randomized method. These models were then structurally optimized by hybrid Monte Carlo/molecular dynamics (MC/MD) simulations to eliminate the effects of lattice distortion and defects induced by atomic radius differences. Furthermore, a microscopic dynamic model of arc ablation was established based on vacuum arc ablation characteristics. The ablative mass served as a quantitative parameter to characterize ablation resistance, which provides a theoretical foundation for studying the ablation resistance of contact materials and guiding doping-enhanced design.
Subsequently, the microscopic arc ablation mechanism of CuCr contact materials was systematically investigated to guide the doping-enhanced design. The arc ablation simulation results demonstrate that the ablation resistance of CuCr contact materials, primarily influenced by erosion-deposition atoms, exhibits a positive correlation with Cr content. Through simulations of 60 Mo/W-doped CuCr contact materials, Cu₄₇Cr₅₀W₃ was identified as the optimal composition with the highest ablation resistance. Additionally, it was also found that CuCr alloys containing 70%~80% Cu atoms possess the greatest potential for ablation resistance enhancement through doping.
Finally, the non-thermodynamic macrostatic physical parameters of the ablation-resistant CuCr contact materials were characterized. The mechanical properties of CuCr alloys are enhanced with increasing Cr content. However, Cr has been identified as a critical factor in reducing the electrical conductivity of CuCr alloys, as Cr atoms possess numerous s- and p-orbital electrons distributed in energy levels below -40 eV, which exhibit low transition probabilities to the conduction band. Among the screened ablation-resistant doped alloys, Cu₈₇Cr₁₀Mo₃, Cu₈₀Cr₁₈Mo₂ and Cu₆₇Cr₃₀W₃ demonstrate superior properties compared to their matrix alloys in terms of deformation resistance, fusion weld resistance, and hardness. Notably, certain mechanical properties of Cu₆₇Cr₃₀W₃ are now equivalent to those of CuCr₄₀ and CuCr₅₀. Unfavorably, the addition of Mo and W reduces the population of valence band electrons between -10 eV and 0 eV that can participate in conduction, resulting in conductivity that remains predominantly governed by the Cu content. Considering the balance between ablation resistance, mechanical properties, and electrical conductivity, CuCr doped alloys with 70%~80% Cu atoms content demonstrate optimal comprehensive performance. Alloy systems in this range should be the focus of future research on high-performance contact materials.

Key words： Vacuum circuit breaker CuCr alloy ablation resistance molecular dynamics first principles

收稿日期: 2025-06-25

PACS:

TM561.2

基金资助:特种电机与高压电器教育部重点实验室开放课题（KFKT202203）和河北省省级科技计划（21567605H）资助项目

通讯作者: 冯大伟男,1992年生,副教授,研究方向为环保型绝缘材料、电气设备绝缘的在线检测与故障诊断、传感器等。E-mail：josaturday@hebut.edu.cn

作者简介: 刘婷婷女,1999年生,硕士研究生,研究方向为真空断路器触头材料的劣化机制与其性能提升。E-mail：2749647357@qq.com

引用本文:

冯大伟, 刘婷婷, 符心烨, 李哲, 刘晓明. 真空断路器CuCr触头材料烧蚀动力学仿真与掺杂设计[J]. 电工技术学报, 2026, 41(13): 4538-4553. Feng Dawei, Liu Tingting, Fu Xinye, Li Zhe, Liu Xiaoming. Simulation on Ablation Dynamics and Doping Design of CuCr Contact Materials for Vacuum Circuit Breakers. Transactions of China Electrotechnical Society, 2026, 41(13): 4538-4553.

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