电工技术学报  2015, Vol. 30 Issue (20): 65-70    DOI:
电机与电器 |
用场路耦合模拟变压器线圈部分短路故障电流的方法
张俊杰,刘兰荣,刘东升,刘力强,张喜乐,胡启凡
保定天威保变电气股份有限公司电工技术研究所 保定 071056
A Method of Simulating the Fault Current Using Field-Circuit Coupling for Partially Short-Circuited Transformer Winding
Zhang Junjie, Liu Lanrong, Liu Dongsheng, Liu Liqiang, Zhang Xile, Hu Qifan
Institute of Electrotechnology Baoding Tianwei Baobian Electric Co. Ltd Baoding 071056 China
全文: PDF (430 KB)  
输出: BibTeX | EndNote (RIS)      
摘要 通过场路耦合的方法计算了变压器匝间短路、饼间短路等线圈各种假设短路故障工况,获得故障状态下的线端短路稳态电流和阻抗参数,再根据计算得到的系统参数和故障时刻初相角,通过数学模型模拟出短路发生后的故障瞬态波形,若与实际故障录波对比可以推断短路故障的起因。通过对某台大型单相电力变压器验算,证明了该系统故障由非线圈短路引起。
服务
把本文推荐给朋友
加入我的书架
加入引用管理器
E-mail Alert
RSS
作者相关文章
张俊杰
刘兰荣
刘东升
刘力强
张喜乐
胡启凡
关键词 变压器短路故障场路耦合有限元    
Abstract:The inter-turn short circuit, the inter-segment short circuit and various hypothetic coil short-circuit faults of transformers are calculated with field-circuit coupling method. Then the steady short circuit current on the line end and the impedance in the fault state can be obtained. According to the calculated system parameters and the initial phase angle in the fault time, the fault transient waveform can be simulated with math method. It can be used to infer the reason of short current fault by comparing this waveform with the one in the fault recorder. It is proved that the system fault is not caused by the coil short-circuit fault by applying the proposed method to large single-phase power transformer.
Key wordsTransformer    short circuit    stray loss    field-circuit coupling    finite element method   
收稿日期: 2013-10-08      出版日期: 2015-10-30
PACS: TM406  
作者简介: 张俊杰 男,1975年生,硕士,高级工程师,主要从事重特新型大型电力变压器、电抗器和电流互感器的电、磁、热仿真评估和设计研发以及电磁基础理论、电磁材料科研工作。刘兰荣 女,1978年生,硕士,高级工程师,主要从事电磁实验研究及相关仿真工作。
引用本文:   
张俊杰,刘兰荣,刘东升,刘力强,张喜乐,胡启凡. 用场路耦合模拟变压器线圈部分短路故障电流的方法[J]. 电工技术学报, 2015, 30(20): 65-70. Zhang Junjie, Liu Lanrong, Liu Dongsheng, Liu Liqiang, Zhang Xile, Hu Qifan. A Method of Simulating the Fault Current Using Field-Circuit Coupling for Partially Short-Circuited Transformer Winding. Transactions of China Electrotechnical Society, 2015, 30(20): 65-70.
链接本文:  
https://dgjsxb.ces-transaction.com/CN/Y2015/V30/I20/65