Abstract：Vacuum circuit breakers are essential in medium/high voltage systems for the compact and eco-friendly design. Spiral slot transverse magnetic (TMF) contacts enhance arc control by slot-generated magnetic fields, but repeated arc crossing over slots induces localized erosion and slot filling, degrading performance.This study systematically investigates the slot-crossing process of vacuum arcs between spiral groove transverse magnetic (TMF) contacts, focusing on the dynamic evolution of arc morphology, plasma behavior, and their impacts on contact erosion and interruption performance. The slot-crossing process, where the arc transitions across spiral slots, critically influences contact ablation and arc motion stability. Understanding this process is essential for optimizing TMF contact design and enhancing the interruption capability of vacuum circuit breakers. By combining experimental observations with magnetohydrodynamic (MHD) simulations, this work elucidates the arc behavior during slot-crossing, including stagnation, anode-cathode jet separation, and velocity variations, providing insights into the interaction between arc dynamics and slot structures. Experimental studies were conducted using a detachable vacuum chamber equipped with high-speed CCD cameras (20 000~22 000 frame per second) to capture arc morphology and voltage-current waveforms under peak currents ranging from 12 kA to 24 kA. The arc evolution during slot-crossing was categorized into four stages: initial expansion, unstable transition, motion, and diffusion. Key findings revealed that during slot-crossing, the arc transitions from a constricted mode to an anode jet mode, accompanied by a voltage drop of ~13 V. The arc stagnates near the slot edge, with its velocity decreasing by 80% (from ~300 m/s to 60 m/s), intensifying localized erosion. Higher peak currents prolonged the motion stage and stabilized arc morphology, reducing voltage fluctuations. Multi-angle imaging further quantified the arc trajectory, showing that slot-crossing accounted for a significant portion of the motion stage duration, highlighting its role in governing overall arc dynamics. For simulation, a 2D transient MHD model was developed, coupling electromagnetic fields, plasma transport, and energy conservation equations. The model incorporated sheath layer effects, ionization, and heat flux interactions at electrode surfaces. Simulation results aligned with experimental observations, demonstrating ion density concentrations (up to 8.5×1023 m-3) and current density peaks (~1010 A/m2) near slot edges during slot-crossing. The sheath voltage at the cathode and anode surged to 29 V and 33 V, respectively, driving Joule heating (6.9×1010 W/m2 at the anode and 4.3×1010 W/m2 at the cathode) and material evaporation. The model validated the two-stage crossing mechanism: arc transitions from concentrated to anode-jet mode (voltage drop) and reverts post-crossing (voltage recovery), aligning with experimental observations. The following conclusions are drawn: (1) The arc slot-crossing process comprises two distinct phases: a transition from a constricted mode (with voltage drop) to an anode jet mode, followed by re-constriction (voltage recovery), which reduces arc velocity by ~80% and intensifies groove-edge erosion due to prolonged localized heating. (2) Reducing the slot-crossing duration significantly enhances arc mobility, mitigates contact damage, and improves interruption performance by minimizing energy deposition in critical regions. (3) Optimizing groove geometry (e.g., slot width and number) is essential to balance electromagnetic force distribution and ablation resistance, providing critical theoretical and technical guidance for designing high-performance TMF contacts and advancing vacuum interrupters in alignment with sustainable energy goals.
韦乐铭, 修士新, 安珉昊, 王嘉欣, 林杏宇. 螺旋槽横磁触头间真空电弧跨槽过程的实验与仿真研究[J]. 电工技术学报, 2026, 41(3): 1012-1025.
Wei Leming, Xiu Shixin, An Minhao, Wang Jiaxin, Lin Xingyu. Experimental and Simulation Study on the Vacuum Arc Crossing Process Between Spiral Slot Transverse Magnetic Contacts. Transactions of China Electrotechnical Society, 2026, 41(3): 1012-1025.
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