Abstract：A novel analog fault diagnosis method applying multi-frequency response information fusion is proposed. Several signals with different frequencies are selected as the inputs of the analog circuit. The responses are processed by wavelet analysis and normalized to be the fault mode feature vectors. The test sample is associated with the fault mode feature vectors by gray correlation degrees, which constitute the basic probability assignment function. Different frequency responses in time-frequency domain act as the different evidences, which are fused by the D-S evidence reasoning to be a consistent diagnosis conclusion. Experimental results show that the proposed method is more accurate and costs less than the methods in being. It is effective even in the slight soft fault diagnosis.
钟建林, 何友, 王红星. 基于多频小波分析和D-S推理的电路故障诊断[J]. 电工技术学报, 2010, 25(8): 180-184.
Zhong Jianlin, He You, Wang Hongxing. Circuit Fault Diagnosis Based on Multi-Frequency Wavelet Analysis and D-S Reasoning. Transactions of China Electrotechnical Society, 2010, 25(8): 180-184.
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