Abstract：Cell electrofusion technology is usually performed by short-term high-voltage electrical pulses with a duration of microseconds to induce cell electroporation. However, exposure to high amplitude microsecond pulses can easily lead to excessive cell electroporation while promoting cell electrofusion, resulting in the death of the fused cells, thereby limiting the efficiency of cell fusion. To increase the rate of cell electrofusion, this paper proposes a method of synergistic induction of cell electrofusion by combining nanosecond and microsecond pulsed electric fields, based on the phenomenon of “super-electroporation” induced by nanosecond pulsed electric field. In this paper, SP2/0 mouse myeloma cells are used as the experimental object. The COMSOL software is used to analyze the distribution of transmembrane voltage and electroporation density on the cell membrane under the exposure of the composite pulse, and preliminary electrofusion experiments are performed to explore the mortality and fusion rate of the fusion method. The simulation results show that under the traditional microsecond pulse, the transmembrane voltage across the two poles of the membrane and the contact area both exceed the perforation threshold, and the significant perforation area exceeds 10%. Besides, under the action of the same dose of nano/microsecond composite pulse, the transmembrane voltage only reaches a higher value in the cell contact area, and the electroporation is also concentrated in this area. Experimental results also prove that this method can guarantee a lower mortality rate (10%) while achieving a higher cell fusion efficiency (75%), which provides new ideas for the further development of cell electrofusion technology.
李成祥, 李新皓, 柯强, 姚成, 姚陈果. 纳/微秒复合脉冲提高细胞电融合效率的仿真与实验研究[J]. 电工技术学报, 2022, 37(6): 1522-1532.
Li Chengxiang, Li Xinhao, Ke Qiang, Yao Cheng, Yao Chenguo. Simulation and Experimental Research on Improving the Efficiency of Cell Electrofusion by Nano-Microsecond Pulsed Electric Fields. Transactions of China Electrotechnical Society, 2022, 37(6): 1522-1532.
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