X射线激励对SF<sub>6</sub>中直流针尖放电的影响

doi:10.19595/j.cnki.1000-6753.tces.181802

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摘要国外已有研究表明,X射线激励能影响固体绝缘中微小气隙缺陷局部放电的特性。为了研究X射线激励对SF₆气体中针尖缺陷局部放电的影响,搭建了基于实体252kV GIS的局部放电试验平台,设计了GIS中常见的针尖放电模型,基于特高频方法测量了X射线激励下直流电压针尖缺陷的放电特性。对该文设计的长15mm、曲率半径为50μm的针尖缺陷,X射线能够分别降低正、负极性下的针尖放电起始电压约28.6%和15.6%;提高正、负极性放电脉冲重复率（正极性5.3~17.0倍,负极性80.4~166.7倍）;降低正极性放电的特高频信号幅值约35.3%。X射线能够电离SF₆气体,在针尖缺陷附近产生光电离,为放电区域提供有效电子,从而降低放电统计时延,降低局部放电的起始电压,实现局部放电特征的外部调控。研究结果可以为直流GIS/GIL绝缘缺陷局部放电检测提供一种手段。

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	张强
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关键词 ： X射线, 针尖缺陷, 直流电压, 局部放电, 特高频

Abstract：The foreign scholars indicated that the X-ray could conspicuously excite partial discharge (PD) of tiny air voids in solid insulation. In order to probe into the practicability of this method for needle discharge in SF₆, a PD test platform based on real 252 kV gas insulated switchgears (GIS) was built and the common needle discharge model in GIS was designed. Then, through the ultra-high frequency (UHF) method, the discharge characteristics of the needle discharge model under the direct current (DC) voltage induced by X-ray were measured. The PD tests were based on the specific needle defect with 50μm curvature radius and 15mm length. The results show that X-ray can reduce the partial discharge inception voltage (PDIV) by about 28.6% and 15.6% under positive and negative DC voltages, significantly increase discharge counts for about 5.3 to 17.0 times under positive voltage and about 80.4 to 166.7 times under negative voltage respectively, and reduce the UHF signal amplitude by about 35.3% under positive voltage. Finally, the possible mechanism is that X-ray can ionize SF₆ near the needle and the photoionization can provide sufficient electrons, which will reduce the time lag of gas discharges and lower the PDIV correspondingly. The results show that the PD in SF₆ can be regulated by the X-ray and this method is meaningful to the detection of insulation defects in DC GIS and GIL.

Key words： X-ray needle defect DC voltage partial discharge ultra-high frequency

收稿日期: 2018-11-20 出版日期: 2019-12-30

PACS:

TM83

通讯作者: 张瀚驰，男,1993年生,硕士,研究方向为电气设备在线监测。E-mail:zhanghanchi@ncepu.edu.cn

作者简介: 张强，男,1990年生,博士研究生,研究方向为电气设备在线监测。E-mail:zhangqiang@ncepu.edu.cn

引用本文:

张强, 张瀚驰, 李成榕, 马国明. X射线激励对SF₆中直流针尖放电的影响[J]. 电工技术学报, 2019, 34(24): 5282-5288. Zhang Qiang, Zhang Hanchi, Li Chengrong, Ma Guoming. Impact of X-Ray on Needle Discharge in SF₆ Under DC Voltage. Transactions of China Electrotechnical Society, 2019, 34(24): 5282-5288.

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https://dgjsxb.ces-transaction.com/CN/10.19595/j.cnki.1000-6753.tces.181802 https://dgjsxb.ces-transaction.com/CN/Y2019/V34/I24/5282

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