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Other articles related with "TD685":
1943
Zhu Ran, Xu Liwen, Meng Qinghai
Arc Discharge Model of Resistive Intrinsically Safe Circuit Based on Functional Data Analysis Algorithm
Transactions of China Electrotechnical Society 2024 Vol.39 (7): 1943-1956 [
Abstract
] (
25
) [
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1 KB] [
PDF
2078 KB] (
85
)
676
Meng Qinghai, Tian Yuan
Analysis of Potential Hazards of Analog Energy Storage Components in the Intrinsic Safety Circuits and Their Intrinsic Safety Criteria
Transactions of China Electrotechnical Society 2022 Vol.37 (3): 676-685 [
Abstract
] (
164
) [
HTML
1 KB] [
PDF
1974 KB] (
500
)
119
Meng Qinghai, Wang Jinji
Dual Normal Distribution of Arc Discharge Time for Inductive Intrinsically Safe Circuits
Transactions of China Electrotechnical Society 2017 Vol.32 (2): 119-124 [
Abstract
] (
446
) [
HTML
1 KB] [
PDF
6738 KB] (
1956
)
230161
Zhu Ran, Xu Liwen, Meng Qinghai
Research on Arc Discharge Model of Resistive Intrinsically Safe Circuit Based on Functional Data Analysis Algorithm
Transactions of China Electrotechnical Society 0 Vol. (): 230161-230161 [
Abstract
] (
34
) [
HTML
1 KB] [
PDF
1798 KB] (
128
)
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