Transactions of China Electrotechnical Society  2017, Vol. 32 Issue (13): 14-22    DOI: 10.19595/j.cnki.1000-6753.tces.170594
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A Coupled 3D Finite Element-Circuit Model for the Numerical Analysis of Small Time Scale Transients of an Insulated Gate Bipolar Transistor Power Electronics Device
Ma Yuhan, Chen Jiajia, Hu Sideng, Yang Shiyou
College of Electrical Engineering Zhejiang University Hangzhou 310027 China

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