基于采样序列重构的高精度介质损耗角测量方法

doi:10.19595/j.cnki.1000-6753.tces.171699

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摘要为准确测量介质损耗角,克服基波频率波动、采样率不同、模数转换器位数变化及噪声干扰等因素影响,提出一种基于时域采样序列重构的介质损耗角测量方法。通过对原始采样序列进行移频滤波实现对基波频率的准确估计,结合估计基波频率和三次样条插值方法实现实际电压和电流采样序列的重构,通过对重构后的电压和电流采样序列分别进行快速傅里叶变换实现介质损耗角的准确求取。仿真结果表明所提算法能够实现对介质损耗角的准确测量且不受非同步采样限制和噪声的影响。实际构建的硬件测试平台验证了该算法的准确性。

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	王永
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关键词 ：介质损耗角, 移频, 滤波, 快速傅里叶变换, 三次样条插值

Abstract：In order to measure dielectric loss angle (DLA) accurately, and overcome the defects caused by fundamental frequency fluctuation, sampling rate, word length of the analog-to-digital converter, and noise, a dielectric loss angle measurement algorithm based on sequence reconstruction is proposed in this paper. Firstly, the fundamental frequency is estimated accurately through frequency shifting and filtering on the original sampling sequence. Then, the sampling sequence of actual voltage and current is reconstructed by combining the estimated frequency and cubic spline interpolation method. Finally, the fast Fourier transform of the reconstructed voltage and current sampling sequence is implemented to obtain the dielectric loss angle accurately. Simulation results show that the new algorithm proposed in this paper can accurately measure the dielectric loss angle, which is not affected by the limit of asynchronous sampling and the influence of noise. The practical experiments using the hardware test platform verified the accuracy and effectiveness of the new algorithm.

Key words： Dielectric loss frequency shifting filtering fast Fourier transform cubic spline interpolation

收稿日期: 2017-12-15 出版日期: 2018-12-17

PACS:

TM935

基金资助:国家自然科学基金面上项目资助（51377049）

作者简介: 王永男,1979年生,博士研究生,研究方向为电力信号分析、信息融合与智能信息处理。E-mail：wangyong1179@163.com;滕召胜男,1963年生,教授,博士生导师,研究方向为电气测量技术及智能信息处理技术。E-mail：tengzs@126.com（通信作者）

引用本文:

王永, 滕召胜, 李建闽, 唐求, 成达. 基于采样序列重构的高精度介质损耗角测量方法[J]. 电工技术学报, 2018, 33(23): 5607-5615. Wang Yong, Teng Zhaosheng, Li Jianmin, Tang Qiu, Cheng Da. High Accuracy Dielectric Loss Angle Measurement Method Based on Sampling Sequence Reconstruction. Transactions of China Electrotechnical Society, 2018, 33(23): 5607-5615.

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https://dgjsxb.ces-transaction.com/CN/10.19595/j.cnki.1000-6753.tces.171699 https://dgjsxb.ces-transaction.com/CN/Y2018/V33/I23/5607

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