Abstract:Based on the device to system grade and multi-timescale characteristics of thermal network, a method of thermal modelling is proposed. The thermal network model of insulated gate bipolar transistor (IGBT) is established based on the network structure of RC and thermal theory. The operation rules of junction temperature, simplified standard and method of single-layer and multi-layer network structure is found out. On this basis, taking the different requirements of device to system for thermal model as the main line and the different timescale of each package layer time constant as the breakthrough point, the IGBT thermal models for device to system thermal simulation are established. The results of simulations and experiments verify the rightness and accuracy of the established models. It is significant in theory and practical application for finding out the characteristics of thermal network structure and the operation rules of junction temperature and realizing the independent and joint simulation of power electronic device to system.
刘宾礼, 罗毅飞, 肖飞, 汪波. 适用于器件级到系统级热仿真的IGBT传热模型[J]. 电工技术学报, 2017, 32(13): 1-13.
Liu Binli, Luo Yifei, Xiao Fei, Wang Bo. IGBT Thermal Model for Thermal Simulation of Device to System. Transactions of China Electrotechnical Society, 2017, 32(13): 1-13.
[1] Ender F, Hantos G, Schweitzer D, et al. Thermal characterization of multichip structures[C]//Pro- ceedings of the 19th International Workshop on Thermal Investigation of ICs and Systems, Berlin, 2013: 319-322. [2] Evans P L, Castellazzi A, Johnson C M. Automated fast extraction of compact thermal models for power electronic modules[J]. IEEE Transactions on Power Electronic, 2013, 28(10): 4791-4802. [3] D'Arco S, Gustavsen B. Reduced order thermal modeling of power electronics modules via time domain vector fitting[C]//Proceedings of 17th Signal Power Integrity, Paris, 2013: 1-4. [4] 何湘宁, 吴岩松, 罗皓泽, 等. 基于IGBT离线测试平台的功率逆变器损耗准在线建模方法[J]. 电工技术学报, 2014, 29(6): 1-7. He Xiangning, Wu Yansong, Luo Haoze, et al. Quasi-online modeling method of the power inverter losses based on IGBT offline test platform[J]. Transactions of China Electrotechnical Society, 2014, 29(6): 1-7. [5] Wu R, Wang H, Ma K, et al. A temperature- dependent thermal model of IGBT modules suitable for circuit-level simulations[C]//Proceedings of the IEEE Energy Conversion Congress and Exposition (ECCE), Pittsburgh, 2014: 2901-2908. [6] 万萌, 应展烽, 张旭东, 等. 功率器件集总参数热路模型及其参数提取研究[J]. 电工技术学报, 2015, 30(21): 31-38. Wan Meng, Ying Zhanfeng, Zhang Xudong, et al. Research on the lumped parameter thermal circuit model and the parameter extraction method of power devices[J]. Transactions of China Electrotechnical Society, 2015, 30(21): 31-38. [7] Ziabari A, Je-Hyoung P, Ardestani E K, et al. Power blurring: fast static and transient thermal analysis method for packaged integrated circuits and power devices[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22(11): 2366-2379. [8] Li H, Liao X, Li Y, et al. Improved thermal couple impedance model and thermal analysis of multi-chip paralleled IGBT module[C]//IEEE Energy Conversion Congress and Exposition (ECCE), Montreal, 2015: 3748-3753. [9] Gorecki K, Zarebski J. Modeling the influence of selected factors on thermal resistance of semicon- ductor devices[J]. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2014, 4(3): 421-428. [10] Ma K, Bahman A S, Beczkowski S, et al. Complete loss and thermal model of power semiconductors including device rating information[J]. IEEE Transa- ctions on Power Electronic, 2015, 30(5): 2556-2569. [11] 陈民铀, 高兵, 杨帆, 等. 基于电-热-机械应力多物理场的IGBT焊料层健康状态研究[J]. 电工技术学报, 2015, 30(20): 252-260. Chen Minyou, Gao Bing, Yang Fan, et al. Healthy evaluation on IGBT solder based on electro-thermal- mechanical analysis[J]. Transactions of China Electrotechnical Society, 2015, 30(20): 252-260. [12] Drofenik U, Cottet D, Musing A, et al. Com- putationally efficient integration of complex thermal multi-chip power module models into circuit simu- lators[C]//IEEE Energy Conversion Congress and Exposition (ECCE), Nagoya, 2007: 550-557. [13] Gachovska T K, Tian B, Hudgins J L, et al. A real-time thermal model for monitoring of power semiconductor devices[J]. IEEE Transactions on Industry Applications, 2015, 51(4): 3361-3367. [14] Ma K, Liserre M, Blaabjerg F, et al. Thermal loading and lifetime estimation for power device considering mission profiles in wind power converter[J]. IEEE Transactions on Power Electronics, 2015, 30(2): 590- 602. [15] Batard C, Ginot N, Antonios J. Lumped dynamic electrothermal model of IGBT module of inverters[J]. IEEE Transactions on Components, Packing and Manufacturing Technolgy, 2015, 5(3): 355-364. [16] Luo Zhaohui, Ahn H, Nokali M A E. A thermal model for insulated gate bipolar transistor module[J]. IEEE Transactions on Power Electronics, 2004, 19(4): 902-907. [17] Ma K, Blaabjerg F. Multi-time scale modelling for the loading behaviours of power electronics con- verter[C]//IEEE Energy Conversion Congress and Exposition (ECCE), Montreal, 2015: 5749-5756. [18] 陈明. IGBT传热特性及电热耦合特性与寿命预测研究[D]. 武汉: 海军工程大学, 2012.