Abstract:The change law of Penning ionization in atmospheric helium dielectric barrier discharges (DBDs) with air impurity was investigated. Discharge inception voltage and emission spectra were measured under different background air pressures (BAPs) changing from 0.8Pa to 1000Pa. Results of these two kinds of methods showed that in a range of BAP from 0.8Pa to 190Pa, discharge inception voltage decreased obviously and the 391.4nm line intensity increased with the BAP. When BAP arrives at more than 190Pa, discharge inception voltage increased linearly obviously and 391.4nm line intensity gradually dropped to lower value with the BAP, even a zero value at last. Emission spectra of helium decreased with the BAP. Physical processes analysis indicated that the results from both discharge inception voltage and emission spectra illustrated that Penning ionization due to helium metastables and N2 changed with the BAP, and the changes of all emission spectra intensities of helium are due to the quenching caused by N2.
郝艳捧, 阳林, 王晓蕾. 含空气杂质大气压氦气介质阻挡放电中彭宁电离作用[J]. 电工技术学报, 2009, 24(8): 22-26.
Hao Yanpeng, Yang Lin, Wang Xiaolei. Investigation of Penning Ionization in Atmospheric Helium Dielectric Barrier Discharges With Air Impurity. Transactions of China Electrotechnical Society, 2009, 24(8): 22-26.
[1] Roth J R, Rahel J, Dai X, et al. The physics and phenomenology of one atmosphere uniform glow discharge plasma (OAUGDPTM) reactors for surface treatment applications[J]. J. Phys. D: Appl. Phys., 2005, 38(4): 555-567. [2] Fang Z, Qiu Y, Luo Y. Surface modification of polytetrafluoroethylene film using the atmospheric pressure glow discharge in air[J]. J. Phys. D: Appl. Phys., 2003, 36(23): 2980-2985. [3] Kanazawa S, Kogoma M, Moriwaki T, et al. Stable glow plasma at atmospheric pressure[J]. J. Phys. D: Appl. Phys., 1988, 21(5): 838-840. [4] Massines F, Rabehi A, Decomps P, et al. Experimental and theoretical study of a glow discharge at atmospheric pressure controlled by dielectric barrier[J]. J. Appl. Phys., 1998, 83(6): 2950-2957. [5] Radu I, Bartnikas R, Wertheimer M R. Diagnostics of dielectric barrier discharges in noble gases: atmospheric pressure glow and pseudoglow discharges and spatio-temporal patterns[J]. IEEE Transactions on Plasma Science, 2003, 31(3): 411-421. [6] Radu I, Bartnikas R, Wertheimer M R. Frequency and voltage dependence of glow and pseudoglow discharge in helium under atmospheric pressure[J]. IEEE Transactions on Plasma Science, 2003, 31(6): 1363-1378. [7] Mangolini L, Anderson C, Heberlein J, et al. Effects of current limitation through the dielectric in atmospheric pressure glows in helium[J]. J. Phys. D: Appl. Phys., 2004, 37(7): 1021-1030. [8] Massines F, Segur P, Gherardi N, et al. Physics and chemistry in a glow dielectric barrier discharge at atmospheric pressure: diagnostics and modeling[J]. Surf. Coat. Technol., 2003, 174-175(5): 8-14. [9] Luo H Y, Liang Z, LV B, et al. Observation of the transition from a Townsend discharge to a glow discharge in helium at atmospheric pressure[J]. Appl. Phys. Lett., 2007, 91(22), 221504. [10] Gherardi N, Massines F. Mechanisms controlling the transition from glow silent discharge to streamer discharge in Nitrogen[J]. IEEE Transactions on Plasma Science, 2001, 29(3): 536-544. [11] Wang Yanhui, Wang Dezhen. The role of metastable atoms in a homogeneous atmospheric pressure barrier discharge in helium[J]. Plasma Science & Technology, 2006, 8(5): 539-543. [12] Xiaohui Y, Raja L L. Role of trace impurities in large-volume noble gas atmospheric-pressure glow discharges[J]. Appl. Phys.Lett., 2002, 81(5): 814-816. [13] Nersisyan G, Graham W G. Characterization of a dielectric barrier discharge operating in an open reactor with flowing helium[J]. Plasma Sources Sci. Technol., 2004, 13(4): 582-587. [14] Nersisyan G, Morrow T, Granham W G. Measurements of helium metastable density in an atmospheric pressure glow discharge[J]. Appl. Phys. Lett., 2004, 85(9): 1487-1489. [15] Luo H Y, Liang Z, Wang X X, et al. Effect of gas flow in dielectric barrier discharge of atmospheric helium[J]. J. Phys. D: Appl. Phys., 2008, 41(20): 205205.