XLPE电缆绝缘热老化的高压频域介电谱诊断方法

doi:10.19595/j.cnki.1000-6753.tces.210962

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Abstract Thermal aging is the important reasons for the degradation of XLPE cable insulation. The timely detection and treatment are of great significance for system operation safety. The research on diagnosis of XLPE cable overall and local aging using high voltage frequency domain spectroscopy (FDS) is carried out. The high voltage FDS (0.01Hz~0.1Hz, detection voltage up to U₀) of 10 kV cables with overall length, with ratio of local thermal aging section to intact cable of 10% and 4% at different thermal aging stages are measured. Besides, the layering degree of the high voltage FDS curves L, slope and integral, and nonlinearity η are defined and analyzed. The effects of local aging ratio on the dielectric parameters are also studied. The results show that high voltage FDS is sensitive to both overall and local thermal aging, The L parameters of cable samples with overall and local thermal aging defects with a certain degree are greater than 1, so L matrix can be used as the diagnostic parameter of cable aging. Nonlinearity η is sensitive to the change of aging degree, and it is less affected by the proportion of local defects, so it can be used as a diagnostic characteristic of cable aging degree. With the decrease of the aging section proportion, the curves show layered characteristics later, and the integral value of dielectric spectrum curve and the slope of the curve are reduced. It can be determined whether the cable is thermal aged by combining the value of η and the range of slope and integral. The hysteresis phenomenon can be used as basis to distinguish thermal aging and water tree aging of XLPE cable.

Key words： XLPE cable thermal aging high voltage frequency domain spectroscopy diagnosis

Received: 23 June 2021

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TM85

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	Wang Haoyue
	Wang Xiaowei
	Sun Maolun
	Wang Wei
	Li Chengrong

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Wang Haoyue,Wang Xiaowei,Sun Maolun等. High Voltage Frequency Domain Dielectric Spectroscopy Diagnosis Method for Thermal Aging of XPLE Cables[J]. Transactions of China Electrotechnical Society, 2022, 37(17): 4497-4507.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.210962 OR https://dgjsxb.ces-transaction.com/EN/Y2022/V37/I17/4497

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