Transactions of China Electrotechnical Society  2022, Vol. 37 Issue (15): 3981-3988    DOI: 10.19595/j.cnki.1000-6753.tces.210724
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Research on Fatigue Life of Contact in 12kV Vacuum Interrupter under Shocking
Dong Huajun1,2, Li Dongheng1, Zhong Jianying2, Zhu Ye1, Guo Fangzhun1
1. School of Mechanical Engineering Dalian Jiaotong University Dalian 116028 China;
2. Pinggao Group Co. Ltd Pingdingshan 467001 China

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Abstract  In the closing process of vacuum interrupter, the contacts often bears large closing impact. After multiple closing operations, the contacts is likely to produce fatigue damage, which affects the performance of vacuum interrupter. In this study, the dynamic simulation model of the operating mechanism of VS1 vacuum circuit breaker is established to calculate the dynamic characteristics of the dynamic contact in the closing process of the circuit breaker. The 3D nonlinear dynamic analysis software LS-DYNA is used to simulate the closing impact collision of cup-shaped axial magnetic field contact, and the stress and strain results of the contact structure at each time under closing impact are obtained. The fatigue life analysis process of vacuum interrupter contact structure is established in nCode software, the dangerous area of contact structure fatigue life is predicted, and the support plate structure is optimized to improve the fatigue life of contact structure. From the results we can see: The slots of the contact plate and the cup fingers of cup-shaped axial magnetic field contact will produce stress concentration phenomenon under shocking, which is easy to be destroyed. The convex support plate can make the stress distribution of the contact structure more reasonable among the three kinds of support plate structures and it can effectively improve the fatigue life of the contact.
Key wordsVS1 vacuum circuit breaker      vacuum interrupter      closing shock      fatigue life of contact     
Received: 18 May 2021     
PACS: TM561  
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Dong Huajun
Li Dongheng
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Zhu Ye
Guo Fangzhun
Cite this article:   
Dong Huajun,Li Dongheng,Zhong Jianying等. Research on Fatigue Life of Contact in 12kV Vacuum Interrupter under Shocking[J]. Transactions of China Electrotechnical Society, 2022, 37(15): 3981-3988.
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