磁性粒子成像线型零磁场设计及性能分析

doi:10.19595/j.cnki.1000-6753.tces.190472

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Abstract Magnetic particle imaging is a tracer imaging technique with high imaging resolution. Aiming at the open scanning problem of the current imaging system, a high-resolution two-dimensional scanning imaging method is realized by a highly sensitive magnetic field-free line. A magnetic field-free line with an open coil structure is designed. The magnetic field-free line is constructed by gradient static magnetic field to determine the position of the tracer, and the uniform alternating magnetic field is used for translation scanning of magnetic field-free line. The coil structure is analyzed in detail. Firstly, the current driving method of the magnetic particle imaging coil system for realizing high resolution is determined. Then the finite element simulation calculation analysis of the open magnetic field-free line scanning method is carried out. Finally, according to the relationship between the driving mode and the range of the translation scanning region, the imaging experiment of the particle quality score model is carried out. The results show that the open coil structure of the magnetic field-free line can realize high resolution imaging of magnetic nanoparticle tracer in the imaging area of 17mm×17mm in a gradient magnetic field of 1.316T/m, the resolution can reach sub-millimeter. It is proved that the magnetic field-free line scanning method is feasible for magnetic particle imaging.

Key words： Magnetic particle imaging open imaging resolution magnetic field-free line finite element simulation

Received: 22 April 2019

PACS:

TM153

Fund:国家自然科学基金（51377109）和辽宁省自然科学基金计划（2019-ZD-0204）资助项目

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	Liu Yangyang
	Du Qiang
	Ke Li
	Zu Wanni

Cite this article:

Liu Yangyang,Du Qiang,Ke Li等. Design and Analysis of Magnetic Field-Free Line in Magnetic Particle Imaging[J]. Transactions of China Electrotechnical Society, 2020, 35(10): 2088-2097.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.190472 OR https://dgjsxb.ces-transaction.com/EN/Y2020/V35/I10/2088

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