[1] 祁锋, 徐隆亚, 王江波, 等. 一种为碳化硅MOSFET设计的高温驱动电路[J]. 电工技术学报, 2015, 30(23): 24-31.
Qi Feng, Xu Longya, Wang Jiangbo, et al.A high temperature gate drive circuit for SiC MOSFET[J]. Transactions of China Electrotechnical Society, 2015, 30(23): 24-31.
[2] Hazra S, De A, Cheng L, et al.High switching performance of 1700V, 50A SiC power MOSFET over Si IGBT/BiMOSFET for advanced power conversion applications[J]. IEEE Transactions on Power Electronics, 2016, 31(7): 4742-4754.
[3] 王旭东, 朱义诚, 赵争鸣, 等. 驱动回路参数对碳化硅MOSFET 开关瞬态过程的影响[J]. 电工技术学报, 2017, 32(13): 23-30.
Wang Xudong, Zhu Yicheng, Zhao Zhengming, et al.Impact of gate-loop parameters on the switching behavior of SiC MOSFETs[J]. Transactions of China Electrotechnical Society, 2017, 32(13): 23-30.
[4] Zeng Zheng, Li Xiaoling.Comparative study on multiple degrees of freedom of gate driver for transient behavior regulation of SiC MOSFET[J]. IEEE Transactions on Power Electronics, 2018, 33(10): 8754-8763.
[5] Camacho A P, Sala V, Ghorbani H, et al.A novel active gate driver for improving SiC MOSFET switching trajectory[J]. IEEE Transactions on Industrial Electronics, 2017, 64(11): 9032-9042.
[6] 朱义诚, 赵争鸣, 王旭东, 等. SiC MOSFET与SiC SBD换流单元瞬态模型[J]. 电工技术学报, 2017, 32(12): 58-69.
Zhu Yicheng, Zhao Zhengming, Wang Xudong, et al.Analytical transient model of commutation units with SiC MOSFET and SiC SBD pair[J]. Transactions of China Electrotechnical Society, 2017, 32(12): 58-69.
[7] 梁美, 李艳, 郑琼林, 等. 高速SiC MOSFET开关特性的测试方法[J]. 电工技术学报, 2017, 32(14): 87-95.
Liang Mei, Li Yan, Zheng Qionglin, et al.Test method for switching performance of high speed SiC MOSFET[J]. Transactions of China Electrotechnical Society, 2017, 32(14): 87-95.
[8] Guo Suxuan, Zhang Liqi, Lei Yang, et al.3.38MHz operation of 1.2kV SiC MOSFET with integrated ultra-fast gate drive[C]//2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Application Blacksburg, VA, USA, 2016: 390-395.
[9] Kim T, Jang M, Agelidis V G.Ultra-fast MHz range driving circuit for SiC MOSFET using frequency multiplier with eGaN FET[J]. IET Power Electronics, 2016, 9(10): 2085-2094.
[10] Chennu J V P S, Maheshwari R, Li H. New resonant gate driver circuit for high-frequency application of silicon carbide MOSFETs[J]. IEEE Transactions on Industrial Electronics, 2017, 64(10): 8277-8287.
[11] Mashhadi I A, Soleymani B, Adib E, et al.A dual-switch discontinuous current-source gate driver for narrow on-time Buck converter[J]. IEEE Transa- ctions on Power Electronics, 2017, 33(5): 4215-4223.
[12] Nayak P, Pramanick S K, Rajashekara K.A high temperature gate driver for silicon carbide MOSFET[J]. IEEE Transactions on Industrial Electronics, 2018, 65(3): 1955-1964.
[13] 金淼鑫, 高强, 徐殿国. 一种基于BJT的耐200℃高温碳化硅MOSFET驱动电路[J]. 电工技术学报, 2018, 33(6): 1302-1311.
Jin Miaoxin, Gao Qiang, Xu Dianguo.A 200℃ silicon carbide MOSFET gate driving circuit based on BJT[J]. Transactions of China Electrotechnical Society, 2018, 33(6): 1302-1311.
[14] Qin Haihong, Dong Yaowen, Xu Kefeng, et al.A comprehensive study of the short-circuit charac- teristics of SiC MOSFETs[C]//IEEE Conference on Industrial Electronics and Applications, Siem Reap, Cambodia, 2017: 332-336.
[15] Romano G, Fayyaz A, Riccio M, et al.A com- prehensive study of short-circuit ruggedness of silicon carbide power MOSFETs[J]. IEEE Journal of Emerging & Selected Topics in Power Electronics, 2016, 4(3): 978-987.
[16] Wang Jun, Jiang Xi, Li Zongjian, et al.Short-circuit ruggedness and failure mechanisms of Si/SiC hybrid switch[J]. IEEE Transactions on Power Electronics, 2018, 34(3): 2771-2780.
[17] Reigosa P D, Iannuzzo F, Luo H, et al.Investigation on the short circuit safe operation area of SiC MOSFET power modules[C]//2016 IEEE Energy Conversion Congress and Exposition (ECCE), Milwaukee, WI, USA, 2017:1-6.
[18] Awwad A E, Dieckerhoff S.Short-circuit evaluation and overcurrent protection for SiC power MOSFETs[C]// 2015 17th European Conference on Power Electro- nics and Applications, Geneva, Switzerland, 2015, DOI: 10.1109/EPE.2015.7311701.
[19] 武晶晶, 郭希铮, 李志坚, 等. SiCMOSFET短路保护电路研究[J]. 电力电子技术, 2017(9): 51-56.
Wu Jingjing, Guo Xizheng, Li Zhijian, et al.Research on short-circuit protection methods for SiC MOSFET[J]. Power Electronics, 2017(9): 51-56.
[20] Reigosa P D, Iannuzzo F, Luo H, et al.A short-circuit safe operation area identification criterion for SiC MOSFET power modules[J]. IEEE Transactions on Industry Applications, 2017, 53(3): 2880-2887.
[21] Wang Zhiqiang, Shi Xiaojie, Tolbert Leon M, et al.Temperature-dependent short-circuit capability of silicon carbide power MOSFETs[J]. IEEE Transa- ctions on Power Electronics, 2016, 31(2): 1555-1566.
[22] 邵伟华, 冉立, 曾正, 等. SiC MOSFET短路特性评估及其温度依赖性模型[J]. 中国电机工程学报, 2018, 38(7): 2121-2131.
Shao Weihua, Ran Li, Zeng Zheng, et al.Short- circuit evaluation and temperature-dependent model of SiC MOSFET[J]. Proceedings of the CSEE, 2018, 38(7): 2121-2131.
[23] Bertelshofer T, Maerz A, Bakran M M.Design rules to adapt the desaturation detection for SiC MOSFET modules[C]//PCIM Europe 2017; International Exhi- bition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg, Germany, 2017: 1-8.
[24] Ji S, Laitinen M, Huang X, et al.Short circuit characterization and protection of 10kV SiC MOSFET[J]. IEEE Transactions on Power Electro- nics, 2019, 34(4): 1755-1764.
[25] Sadik D P, Colmenares J, Tolstoy G, et al.Short- circuit protection circuits for silicon-carbide power transistors[J]. IEEE Transactions on Industrial Electronics, 2016, 63(4): 1995-2004.
[26] Krone T, Xu Chengzhi, Mertens A.Fast and easily implementable detection circuits for short-circuits of power semiconductors[C]//2015 IEEE Energy Con- version Congress and Exposition (ECCE), Montreal, QC, Canada, 2017, DOI: 10.1109/ECCE.2015.7310041.
[27] 胡亮灯, 孙驰, 陈玉林, 等. 大功率IGBT的短路故障检测[J]. 电工技术学报, 2018, 33(11): 2592-2603.
Hu Liangdeng, Sun Chi, Chen Yulin, et al.Short- circuit fault detection for high-power IGBT[J]. Transactions of China Electrotechnical Society, 2018, 33(11): 2592-2603.
[28] Zhang X, Li H, Brothers J A, et al.A gate drive with power over fiber-based isolated power supply and comprehensive protection functions for 15kV SiC MOSFET[J]. IEEE Journal of Emerging & Selected Topics in Power Electronics, 2016, 4(3): 946-955.
[29] Kar A, Ahmad S S, Narayanan G, et al.Design, performance evaluation, fabrication and testing of a SiC MOSFET gate driver[C]//IEEE International Conference on Signal Processing, Informatics, Com- munication and Energy Systems, Kollam, India, 2017: 1-6.
[30] Shi Yuxiang, Xie Ren, Wang Lu, et al.Switching characterization and short-circuit protection of 1200V SiC MOSFET T-type module in PV inverter application[J]. IEEE Transactions on Industrial Electronics, 2017, 64(11): 9135-9143.
[31] 方跃财. SiC MOSFET特性研究: 驱动、短路与保护[D]. 杭州: 浙江大学, 2018.
[32] Wang Zhiqiang, Shi Xiaojie, Xue Yang, et al.Design and performance evaluation of overcurrent protection schemes for silicon carbide (SiC) power MOSFETs[J]. IEEE Transactions on Industrial Electronics, 2014, 61(10): 5570-5581.
[33] Sun Keyao, Wang Jun, Burgos R, et al.Analysis and design of an overcurrent protection scheme based on parasitic inductance of SiC MOSFET power module[C]// IEEE Applied Power Electronics Conference and Exposition, San Antonio, 2018: 2806-2812.
[34] Yuasa K, Nakamichi S, Omura I.Ultra high speed short circuit protection for IGBT with gate charge sensing[C]//International Symposiu 2010 22nd Inter- national Symposium on Power Semiconductor Devices & IC's (ISPSD), Hiroshima, Japan, 2010: 37-40.
[35] Horiguchi T, Kinouchi S I, Nakayama Y, et al.A fast short-circuit protection method using gate charge characteristics of SiC MOSFETs[C]//IEEE Energy Conversion Congress and Exposition, 2015: 4759-4764.
[36] Li Xinchang, Xu Dawei, Zhu Hongyue, et al.An indirect IGBT over-current detection technique via gate voltage monitoring and analyzing[J]. IEEE Transactions on Power Electronics, 2018, 34(4): 3615-3622.
[37] Wang Jun, Shen Zhiyu, Burgos Rolando, et al.Design of a high-band width Rogowski current sensor for gate-drive short-circuit protection of 1.7kV SiC MOSFET power modules[C]//2015 IEEE 3rd Work- shop on Wide Bandgap Power Devices and Appli- cations (WiPDA), Blacksburg, VA, USA, 2016: 104-107.
[38] Wang Jun, Shen Zhiyu, Burgos Rolando, et al.Integrated switch current sensor for short-circuit protection and current control of 1.7kV SiC MOSFET modules[C]//2016 IEEE Energy Conversion Congress and Exposition (ECCE), Milwaukee, WI, USA, 2017: 1-7.
[39] 张经纬, 李晓辉, 谭国俊. 基于PCB罗氏线圈的SiCMOSFET短路保护研究[J]. 电力电子技术, 2017(8): 26-29.
Zhang Jingwei, Li Xiaohui, Tan Guojun.The PCB Rogowski coil based on short-circuit protection of SiC MOSFET[J]. Power Electronics, 2017(8): 26-29.
[40] Mocevic S, Wang J, Burgos R, et al.Comparison between desaturation sensing and Rogowski coil current sensing for shortcircuit protection of 1.2kV, 300A SiC MOSFET module[C]//IEEE Applied Power Electronics Conference and Exposition, San Antonia, TX, USA, 2018: 2666-2672.
[41] Patrick H, Stefan H, Mark B.Applying the 2D-short circuit detection method to SiC MOSFETs including an advanced soft turn off[C]//PCIM Europe 2018, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Nuremberg, Germany, 2018: 1-7.
[42] 黄先进, 蒋晓春, 叶斌, 等. 智能化IGBT驱动电路研究[J]. 电工技术学报, 2005, 20(4): 89-93.
Huang Xianjin, Jiang Xiaochun, Ye Bin, et al.Research on intelligent IGBT drive circuit[J]. Transa- ctions of China Electrotechnical Society, 2005, 20(4): 89-93.
[43] 杨冬平, 王莉, 江登宇, 等. 降栅压技术在MOSFET驱动中的应用[J]. 电力系统及其自动化学报, 2010, 22(1): 1-4.
Yang Dongping, Wang Li, Jiang Dengyu, et al.Application of drop gate voltage technology in MOSFET drive circuit[J]. Proceedings of the CUS- EPSA, 2010, 22(1): 1-4. |