Transactions of China Electrotechnical Society  2019, Vol. 34 Issue (21): 4519-4528    DOI: 10.19595/j.cnki.1000-6753.tces.181433
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Review of Short-Circuit Detection and Protection of Silicon Carbide MOSFETs
Wu Haifu, Zhang Jianzhong, Zhao Jin, Zhang Yaqian
Jiangsu Provincial Key Laboratory of Smart Grid Technology and Equipment Southeast University Nanjing 210096 China

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