Abstract Polyimide (PI) and other dielectric materials are susceptible to the interaction of charged particles in the space environment, which will lead to the flashover along the surface. In order to reveal the influence factors to the surface flashover and explore the flashover suppression method, a surface flashover test system was established. The flat-plate PI sample was prepared and modified by nano/micron ZnO, also the surface was fluorinated. It is found that compared with the pure PI sample, the surface flashover voltage of the modified and fluorinated samples improved significantly. Based on the secondary electron emission avalanche (SEEA) model, surface characteristic is a decisive factor in the development of flashover. Experiment result shows that ZnO particle introduces more deep traps inthe material which suppresses the ability of charge removal; the particle reduces the degassing rate of the PI interstice which restrains the surface gas lamina; the secondary electron emission coefficient on the surface of the material is declined. Surface fluoridation has many factors to the improvement of flashover. The combination of ZnO modification and surface fluorination can further improve the surface flashovervoltage. Therefore, we consider that surface stability can be improved by ZnO modification and fluorination, thus restrain the SEEA development process and raise the material flashover voltage.
ZhangBo,Wu Jiang,Zheng Xiaoquan. Study of the Surface Stability of Modified Polyimide and the Suppression Method of Surface Flashover under DC Voltage in Vacuum[J]. Transactions of China Electrotechnical Society, 2019, 34(13): 2846-2853.
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2019, Vol. 34 
