Transactions of China Electrotechnical Society  2018, Vol. 33 Issue (1): 158-165    DOI: 10.19595/j.cnki.1000-6753.tces.160966
Contents Current Issue| Next Issue| Archive| Adv Search |
Fault Feature Extraction Method for Analog Circuit Based on Preferred Wavelet Packet
Yuan Lifen1, Sun Yesheng1, He Yigang1, Zhang Yue1, Lü Mi2
1. Institute of Electrical and Automation Hefei University of Technology Hefei 230009 China;
2. College of Electrical & Computer Texas A&M University College Station TEXAS TX77843 USA;

Copyright © Transactions of China Electrotechnical Society
Supported by: Beijing Magtech