老化实验条件下的IGBT寿命预测模型

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Abstract According to the IGBT power cycling test, the power device lifetime models based on the device fatigue damage theory are established, to reduce the maintenance cost, enhance the inverter reliability and provide the theoretical support for the inverter maintenance. Firstly, the ageing experiment theory and the extracting parameters method of the power devices were provided. Secondly, according to device fatigue damage theory, power cycling test platform was established and two test plans were designed to obtain the failure parameters of power module. Finally, the one-dimensional lifetime model using Weibull distribution was established. The advantages and disadvantages of this model were analyzed. Compared with the experimental results, the three-dimensional stretched exponential lifetime model is promoted, which is more reasonable than Coffin-Manson and Arrhenius models.

Key words： Lifetime model, power cycling, Weibull distribution, Arrhenius stretched exponential model, IGBT

Received: 26 August 2014 Published: 03 January 2017

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TM46

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	Articles by authors
	Lai Wei
	Chen Minyou
	Ran Li
	Wang Xuemei
	Xu Shengyou

Cite this article:

Lai Wei,Chen Minyou,Ran Li等. IGBT Lifetime Model Based on Aging Experiment[J]. Transactions of China Electrotechnical Society, 2016, 31(24): 173-180.

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https://dgjsxb.ces-transaction.com/EN/ OR https://dgjsxb.ces-transaction.com/EN/Y2016/V31/I24/173

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