Transactions of China Electrotechnical Society  2015, Vol. 30 Issue (23): 24-31    DOI:
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A High Temperature Gate Drive Circuit for SiC MOSFET
Qi Feng1, Xu Longya1, Wang Jiangbo2, Zhao Bo2, Zhou Zhe2
1.The Ohio State University Columbus 43210 United States
2.Smart Grid Research Institute of State Grid Beijing 102200 China

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