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Analysis on Flashover With Varying Gap Between Inner and Outer Electrodes Under Nanosecond Pulsed Coaxial Electric Field |
Huang Wenli1, 2, Cui Jianfeng1, Sun Guangsheng2 |
1. Zhengzhou Institute of Aeronautical Industry Management Zhengzhou 450015 China 2. Institute of Electrical Engineering of CAS Beijing 100190 China |
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Abstract Under nanosecond pulsed coaxial electric field, surface flashover voltage over interfaces between nylon 1010 and transformer oil almost linearly increases with gap length, and the steeper rising edge of pulse, the higher flashover voltage. Surface flashover properties are closely related to the electric field at the triple junctions of solid-liquid-electrode and the field gradient along the interfaces. Although the greater difference between inner and outer electrode radii enhances electric field strength at the triple junctions and nonuniformity of potential distribution along interfaces, it simultaneously terribly reduces the surface field strength of coaxial inner electrode, so that flashover voltage doesn’t decrease but almost linearly increases with gap length. It is indicated the average flashover strength in coaxial electric field can be estimated by that in uniform electric field for large enough gap。
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Received: 31 December 2008
Published: 07 March 2014
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[1] 刘锡三. 高功率脉冲技术[M]. 北京: 国防工业出版社, 2005. [2] 曾正中. 实用脉冲功率技术引论[M]. 西安: 陕西科学技术出版社, 2003. [3] Martin J C. Nanosecond pulse techniques[J]. Proceedings of the IEEE, 1992, 80(6): 934-945. [4] Martin T H, Guenther A H, Kristiansen M. Martin J C on pulsed power[M]. New York: Plenum Press, 1996. [5] Buttram M. Some future direction for repetitive pulsed power[J]. IEEE Transactions on Plasma Science, 2002, 30(1): 262-266. [6] Sharbaugh A H, Devins J C, Rzad S J. Progress in the field of electric breakdown in dielectric liquids[J]. IEEE Transactions Electr. Insul., 1978, 13(4): 249-276. [7] 黄文力, 孙广生, 严萍. 纳秒脉冲下固液体交接面闪络特性研究进展[J]. 高电压技术, 2005, 31(9): 50-52. Huang Wenli, Sun Guangsheng, Yan Ping. Overview of flashover properties over solid-liquid interfaces under nanosecond pulses[J]. High Voltage Engineering, 2005, 31(9): 50-52. [8] Trinh N G, Rizk F A M, Vincent C. Electrostatic-field optimization of the profile of epoxy spaces for compressed SF6-insulated cables[J]. IEEE Transac- tions on Power Apparatus and Systems, 1980, 99(6): 2164-2174. [9] Menju S, Tsuchikawa Y, Kobayashi N. Electric potential and field of conical insulators for SF6 metalclad switchgear[C]. IEEE Summer Meeting and International Symposium on High Power Testing, 1971: 390-398. [10] 刘其昶. 电气绝缘结构设计原理(下册)[M]. 北京: 机械工业出版社, 1987. [11] 苏建仓, 刘国治, 丁臻杰, 等. 基于SOS的脉冲功率源技术新进展[J]. 强激光与粒子束, 2005, 17(8): 1195-1200. Su Jiancang, Liu Guozhi, Ding Zhenjie, et al. Experiment and applications of SOS-based pulsed power[J]. High Power Laser and Particle Beams, 2005, 17(8): 1195-1200. [12] Su J C, Liu G Z, Ding Y Z, et al. Nanosecond sos-based pulse generator SPG200[C]. 3rd International Symposium on Pulsed Power & Plasma Application, Mianyang, 2002: 258-261. [13] 黄文力, 孙广生, 严萍, 等. 纳秒脉冲电压同轴电场下有机玻璃和尼龙的闪络特性[J]. 强激光与粒子束, 2006, 18(7): 1229-1232. Huang Wenli, Sun Guangsheng, Yan Ping, et al. Flashover properties of polymethyl methacrylate and nylon in coaxial electric field under nanosecond pulse voltage[J]. High Power Laser and Particle Beams, 2006, 18(7): 1229-1232. [14] 黄文力, 孙广生, 严萍, 等. 同轴电极内电极直径变化的边缘效应仿真研究[J]. 电工技术学报, 2006, 21(4): 117-121. Huang Wenli, Sun Guangsheng, Yan Ping, et al. Simulation of brim-effects of coaxial electrode varying with the diameter of internal electrode[J]. Transactions of China Electrotechnical Society, 2006, 21(4): 117-121. [15] Rzad S J, Devins J C, Schwabe R J. The influence of a DC bias on streamers produced by step voltages in transformer oil and over solid/liquid interfaces[J]. IEEE Transactions on Electrical Insulation, 1983, 18(1): 1-10. [16] Kebbabi L, Beroual A. Influence of the properties of materials and the hydrostatic pressure on creepage discharge characteristics over solid/liquid inter- faces[C]. 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2003: 293-296. |
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