Transactions of China Electrotechnical Society  2026, Vol. 41 Issue (7): 2510-2520    DOI: 10.19595/j.cnki.1000-6753.tces.250720
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Analysis of the Hazard of Interface Defects in Epoxy Encapsulation Insulation under Sustained Voltage
Wang Tengteng1, Li Xudong2, Zhou Qinyu1, Liu Runyu1, Ren Ming1
1. State Key Laboratory of Electrical Insulation and Power Equipment Xi’an Jiaotong University Xi’an 710049 China;
2. Institute of Electronic Engineering China Academy of Engineering Physics Mianyang 621000 China

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