Transactions of China Electrotechnical Society  2026, Vol. 41 Issue (16): 5663-5680    DOI: 10.19595/j.cnki.1000-6753.tces.251327
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Reliability Evaluation and Interpretability Analysis of Loose Particle Attribute Recognition Model for Sealed Electronic Equipment
Sun Zhigang, Wang Guotao, Chen Hao, Xiao Kaiwen, Zhai Guofu
MOE Key Laboratory of Reliability and Quality Consistency of Electronic Components Harbin Institute of Technology Harbin 150001 China

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