Transactions of China Electrotechnical Society  2021, Vol. 36 Issue (2): 362-372    DOI: 10.19595/j.cnki.1000-6753.tces.191736
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Impacts of Voltage Probes for Accurate Measurement of High-Frequency Transient Voltage of Wide-Bandgap Devices
He Jie1, Liu Yushan1, Bi Daqiang2, Li Xiao3
1. School of Automation Science and Electrical Engineering Beihang University Beijing 100083 China;
2. State Key Lab of Power Systems Department of Electrical Engineering Tsinghua University Beijing 100084 China;
3. Department of Electrical and Computer Engineering; Texas A&M University College Station 77843 USA;

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Abstract  

With the development of wide-bandgap semiconductor devices, the switching speed of power electronic devices is getting faster, and the operating voltage is increasing, which makes the performance of voltage probes have increasing impacts on the measured transient voltages of power electronic devices. This paper analyzed the measuring principles of several commonly used oscilloscope voltage probes in the laboratory. Their circuit models were built. The impacts from the key factors of the probe, such as the bandwidth/rise time, parasitic inductance and common mode rejection ratio, on measured high-frequency transient voltages were studied. Finally, an experimental platform was built, and the results verified the proposed theoretical analysis.

Key wordsVoltage probe      accurate measurement      transient voltage      wide-bandgap devices     
Received: 12 December 2019     
PACS: TM930.1  
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He Jie
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Cite this article:   
He Jie,Liu Yushan,Bi Daqiang等. Impacts of Voltage Probes for Accurate Measurement of High-Frequency Transient Voltage of Wide-Bandgap Devices[J]. Transactions of China Electrotechnical Society, 2021, 36(2): 362-372.
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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.191736     OR     https://dgjsxb.ces-transaction.com/EN/Y2021/V36/I2/362
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