电工技术学报  2022, Vol. 37 Issue (4): 1031-1040    DOI: 10.19595/j.cnki.1000-6753.tces.210849
高电压与放电 |
微型断路器电寿命评估
何志鹏, 赵虎
西北工业大学自动化学院 西安 710129
Electrical Lifespan Evaluation of Miniature Circuit Breakers
He Zhipeng, Zhao Hu
School of Automation Northwestern Polytechnical University Xi’an 710129 China
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摘要 由电弧烧蚀触头材料而引起触头失效是导致微型断路器电寿命劣化的主要原因,研究微型断路器电寿命评估方法对提高用电网络安全性和可靠性具有重要意义。该文以额定电流16A的微型断路器作为电寿命试验对象,利用高速摄像机观察触头间电弧的运动过程,从电弧电压中提取反映断路器电寿命退化过程的特征量,研究累积燃弧能量、跌落时间与触头烧蚀量之间的对应关系,并利用这两个趋势特征量构建微型断路器电寿命评估模型。研究结果表明,电压跌落时间具有随开断次数增加而增大的趋势。利用试验数据对模型评估准确度进行测试,测试结果表明,该文提出的方法适用不同开断电流的情形,可以用于微型断路器电寿命的评估,评估误差在可接受范围内。
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关键词 微型断路器电弧运动过程趋势特征量评估模型    
Abstract:Contact failure caused by arc ablation of contact materials is the main cause of the electrical-lifespan deterioration for miniature circuit breakers (MCBs). The study of electrical-lifespan evaluation method of MCBs is of great significance for improving safety and reliability of electricity networks. Taking some MCBs with a rated current of 16A as the object of the electrical-lifespan test, this paper observed the process of arc motion happened between moving contact and fixed contact via a high-speed camera, and extracted the characteristic quantities reflecting the degradation process of the MCB electrical lifespan from the waveform of arc voltage. Besides, this paper investigated the corresponding relationship of the contact ablation with the accumulative arcing energy and voltage reducing time respectively, and built an electrical-lifespan evaluation model of MCBs with these two characteristic quantities. The results show that the voltage reducing time has a tendency to increase with the increase of the number of breaking. The model accuracy test by experimental data shows that the evaluation method is suitable for the situation of different currents, and the evaluation error is acceptable, which can be used to assess the electrical lifespan of MCBs.
Key wordsMiniature circuit breakers    the process of arc motion    obvious characteristic quantities    evaluation model   
收稿日期: 2021-06-14     
PACS: TM561.1  
通讯作者: 赵虎 男,1986年生,博士,副教授,主要研究方向为低压开关电器智能化、电器设备状态检测技术。E-mail: hzhao@nwpu.edu.cn   
作者简介: 何志鹏 男,1996年生,硕士研究生,研究方向为低压开关电器寿命评估及可靠性分析。E-mail: 3213325846@qq.com
引用本文:   
何志鹏, 赵虎. 微型断路器电寿命评估[J]. 电工技术学报, 2022, 37(4): 1031-1040. He Zhipeng, Zhao Hu. Electrical Lifespan Evaluation of Miniature Circuit Breakers. Transactions of China Electrotechnical Society, 2022, 37(4): 1031-1040.
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