高压频域介电谱诊断XLPE电缆局部绝缘老化缺陷的研究

doi:10.19595/j.cnki.1000-6753.tces.201093

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Abstract Water tree aging are important reasons for the degradation of XLPE cable insulation. The timely detection and treatment of those aging defects are of great significance for system operation safety. Although very-low frequency (VLF, 0.1Hz) dielectric loss detection is widely used for the cable aging detection, it has low sensitivity for local defects and cannot distinguish the aging defects types. In this paper, high voltage frequency-domain spectroscopy (FDS) is carried out to diagnose XLPE cable insulation aging defects. Through the accelerated aging experiment, the water tree aging and thermal aging defective cable segments are prepared. Then the high-voltage dielectric spectroscopy (0.01~0.1Hz) under different voltage levels is detected on the 27.4m long 10kV cable before and after local aging. The dielectric parameters, layering degree S and the hysteresis degree D of FDS curve, are defined and analyzed. The FDS results are also compared with the VLF (0.1Hz) dielectric loss detection. The results show that the VLF method is difficult to find local thermal aging and 70% water tree penetration defects, while the high-voltage FDS is sensitive to local thermal aging and local water tree aging defects. It is found that the layering degree S of thermal aging and water tree aging samples is greater than 1, which can be used as the criterion of cable aging; the hysteresis degree D of the water tree aging sample is significantly greater than that of the thermal aging sample, which can be used as a characteristic quantity to distinguish thermal aging and water tree aging of XLPE cables.

Key words： Cross-linked polyethylene aging high voltage frequency domain spectroscopy diagnosis

Received: 30 August 2020

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TM835

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	Wang Haoyue
	Li Chengrong
	Wang Wei
	Wang Xiaowei
	Xu Qilong

Cite this article:

Wang Haoyue,Li Chengrong,Wang Wei等. Local Aging Diagnosis of XLPE Cables Using High Voltage Frequency Domain Dielectric Spectroscopy[J]. Transactions of China Electrotechnical Society, 2022, 37(6): 1542-1553.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.201093 OR https://dgjsxb.ces-transaction.com/EN/Y2022/V37/I6/1542

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