Transactions of China Electrotechnical Society  2012, Vol. 27 Issue (5): 180-185    DOI:
Current Issue| Next Issue| Archive| Adv Search |
Reliability Theory and Test Methods of Moulded Case Circuit-Breakers
Lu Jianguo1, Li Kui1, Du Taihang1, Ji Huiyu2
1. Hebei University of Technology Tianjin 300130 China 2. Shanghai Electrical Apparatus Research Institute (Group)Co. Ltd Shanghai 200063 China

Copyright © Transactions of China Electrotechnical Society
Supported by: Beijing Magtech