Transactions of China Electrotechnical Society  2012, Vol. 27 Issue (8): 230-238    DOI:
Current Issue| Next Issue| Archive| Adv Search |
A Fault Diagnosis Approach of Analog Circuit Using Wavelet-Based Fractal Analysis and Kernel LDA
Xiao Yingqun1, Feng Lianggui1, He Yigang2
1. National University of Defense Technology Changsha 410073 China 2. Hefei University of Technology Hefei 23009 China

Copyright © Transactions of China Electrotechnical Society
Supported by: Beijing Magtech