一种基于Chirp-Z变换的闪变测量方法

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Abstract Studying of the IEC flicker meter shows that the instantaneous flicker sensation level S can be calculated directly if the spectrums of fluctuating component of voltage are known. In this paper a novel flicker Measurement method is proposed. First, the square demodulation is used to obtain the fluctuating component of voltage, and then the Chirp-Z transform(CZT) is used to obtain the amplitude and the frequency of wave component, and final the instantaneous flicker sensation level S. To process the wave component by CZT can acquire precise spectrums without prolonging the sampling time and decrease the error produced by spectrum leakage. The IEC flicker meter and new method is compared in simulation and test. The result verified the correctness and efficiency of the theoretical prediction.

Key words： Voltage fluctuation flicker Chirp-Z transform power quality

Received: 07 May 2008 Published: 12 February 2014

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TM715

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	Li Heming
	Kang Wei
	Yan Xiangwu
	Zhang Lixia

Cite this article:

Li Heming,Kang Wei,Yan Xiangwu等. Voltage Flicker Measurement Based on Chirp-Z Transform[J]. Transactions of China Electrotechnical Society, 2009, 24(3): 209-215.

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http://dgjsxb.ces-transaction.com/EN/ OR http://dgjsxb.ces-transaction.com/EN/Y2009/V24/I3/209

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作者简介
李和明男, 1956年生, 教授, 博士生导师, 主要研究方向为电力电子与电力传动、大型发电机在线检测与故障诊断技术的研究。
康伟男, 1977年生, 博士研究生, 主要研究方向为电能质量监测。
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