气体间隙开关触发失效分析及寿命提升方法

doi:10.19595/j.cnki.1000-6753.tces.231908

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摘要

喷射等离子体触发型气体间隙开关响应迅速、结构简单,或将满足多端柔直电网用混合式高压直流断路器换流支路故障快速隔离的动作要求。但重复触发放电累积效应引起气体间隙开关触发劣化进程分析不足,计及多因素影响的触发寿命提升方法研究尚不明晰,为此该文搭建了气体间隙开关触发寿命研究平台,试验结果表明,触发腔性能劣化是气体间隙开关触通失败的主要原因。提高触发回路脉冲电容电压值可有效降低放电时延抖动,但对寿命提升的影响可以忽略。采用阶梯式增大储能电容充电电压值,可明显提升触发寿命及触通稳定性。聚四氟乙烯（PTFE）掺杂无机填充物后,可有效提升等离子体喷射特性,但加剧了触发腔的烧蚀劣化,触发寿命表现为PTFE>PTFE+0.2%MoS₂>PTFE+0.5%Cu粉,研究结果可为气体间隙开关触发失效判断及寿命提升方法提供理论参考和工程应用指导。

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	董冰冰
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关键词 ：气体间隙开关, 电弧烧蚀, 触发失效, 寿命提升, 过电压与接地

Abstract：

The trigger failure problem of gas gap switch triggered by plasma jet is serious under the cumulative trigger effect. In order to realize the long life and high stability conduction of gas gap switch, triggering failure analysis and life enhancement experiments have been carried out based on the gas switch trigger life research platform. Firstly, The degradation process of gas gap switch contact performance under cumulative triggering discharge was studied, and the reasons for its triggering failure was analyzed. On this basis, the trigger life enhancement study was carried out for the reasons of trigger failure. The impact characteristics of pulse voltage, energy storage voltage, and triggering cavity gas generation material on the improvement of gas gap switch lifespan were discussed separately.
The results are as follows:
(1) Under the action of high-voltage pulses and arc currents, the primary and secondary trigger cavities are both subjected to varying degrees of degradation. The ablation products that is continuous accumulation in the first stage cavity absorbs high-voltage pulse energy, and reduces the discharge efficiency and energy density. On the other hand, it obstructs the diffusion and propagation of plasma, affecting the jet stability. The combined effect of the two leads to a decrease in the ability of the primary cavity to form a pre-ionization channel. After the cracks occur in the secondary cavity, the integrity and continuity of its surface are damaged, influencing the focusing and transmitting of arc energy. The plasma jet may diffuse along the crack path, causing unstable jetting and sputtering conditions. The continuous expansion in nozzle diameter further delays the internal energy accumulation process of the plasma, resulting in a significant decrease in jet performance. The deterioration of the trigger cavity performance is the main reason for the trigger failure of the gas gap switch.
(2) Increasing the charging voltage of pulse capacitors can effectively reduce discharge delay jitter, but it does not significantly improve the triggering life. By increasing the charging voltage of the energy-storage capacitor, the triggering life and contact stability can be significantly improved. Increasing the injection energy can significantly improve the plasma injection performance and shorten the breakdown time delay. However, the failure of the trigger cavity caused by multiple and large energy injection in the initial triggering stage is also serious, resulting in a shortened lifespan. Therefore, the critical trigger voltage can be applied at the initial stage of triggering to reduce the over-energy ablation, and then the triggering life can be significantly improved by stepped voltage application. As the number of triggering increases, the contact performance of gas switches under different gas producing materials decreases. In addition, after filling with inorganic materials in polytetrafluoroethylene (PTFE), the conductivity and energy deposition rate of the triggering cavity are significantly improved. After doping 0.5% Cu powder with PTFE, the thermal conductivity and conductivity of the discharge channel are improved, and the performance of the jet plasma is significantly improved. But it exacerbates the ablation degradation of the trigger cavity. After doping with 0.2% MoS₂, the anti-arc ablation ability of the trigger cavity is enhanced, but the plasma injecting performance is poor. The triggering lifetime is manifested as PTFE>PTFE+0.2% MoS₂>PTFE+0.5% Cu powder.

Key words： Gas gap switch arc ablation trigger failure lifespan improvement overvoltage and grounding

收稿日期: 2023-11-15

PACS:

TM84

基金资助:

国家自然科学基金（52107142）、高等学校学科创新引智计划（BP0719039）和中央高校基本科研业务费专项资金（JZ2023HGTB0242）资助项目

通讯作者: 董冰冰男,1987年生,博士（后）,副教授,研究方向为开关类设备及成套装置研制、复杂环境下输电线路外绝缘放电理论与试验研究。E-mail：bndong@126.com

作者简介: 孟岩男,1999年生,硕士研究生,研究方向为脉冲功率等离子体技术。E-mail：2812620591@qq.com

引用本文:

董冰冰, 孟岩, 郭志远. 气体间隙开关触发失效分析及寿命提升方法[J]. 电工技术学报, 0, (): 231908-231908. Dong Bingbing, Meng Yan, Guo Zhiyuan. Trigger Failure Analysis and Life Extension Methods of Gas Gap Switch. Transactions of China Electrotechnical Society, 0, (): 231908-231908.

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