Abstract：Based on the node voltage sensitivities, the circuit-state rule table and the node-voltage-increment-ratio fault dictionary are both deduced to locate the faulty component firstly. Furthermore, the parametric deviation value of the faulty component is calculated from the node voltage increment equations. The new approach has some significant new features of less simulation runs before test, minimal storage space, wide diagnosis scope and precise parameter estimation. The promising experimental results manifest the correctness and effectiveness of the theory and the methodology proposed in this paper well.
叶笠, 王厚军, 田书林, 叶芃. 容差模拟电路软故障诊断的一种方法[J]. 电工技术学报, 2011, 26(5): 119-125.
Ye Li, Wang Houjun, Tian Shulin, Ye Peng. An Approach for Soft Fault Diagnosis on Analog Circuits With Tolerance. Transactions of China Electrotechnical Society, 2011, 26(5): 119-125.
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2011, Vol. 26 
