A Novel Method of Substation Configuration Based on Virtual Impedance
Zhang Jinfang, Wang Zengping, Zhang Yagang, Ma Jing
Key Laboratory of Power System Protection and Dynamic Security Monitoring and Control of Ministry of Education, North China Electric Power University Beijing 102206 China
Abstract：Substation configuration is a vital part of the power system network topology, whose implementation takes plenty of the total time of topology analysis. On the premise that the distributed modeling and parallel treatment of station topology could reduce the time consumption for the whole power system topology analysis, the efficiency improvement of topology analysis focuses on the faster and more accurate substation configuration. By the analysis of the common topology characteristic which respectively exists in the original adjacent matrix and nodal admittance matrix, and in the complete connected adjacent matrix and nodal impedance matrix, a new method of original topology analysis and switch status changed tracking algorithm in the substation is proposed based on the nodal virtual impedance matrix in this paper, which utilizes the addition of the virtual impedances to each switch and the virtual grounding admittance branches to each electrical node. With the topology characteristic and physical significance of node impedance matrix, the aim to substation configuration has been realized by the novel way, and the directional treatment to the original adjacent matrix has been avoided as well. Finally, the example results validate that the new method can be used to finish the original analysis easily and track the change of switch status rapidly and accurately. Comparing to other conventional ways based on adjacent matrix directly, the new method is able to provide an easier way to program and a unified mode to process.
张晋芳, 王增平, 张亚刚, 马静. 基于虚拟阻抗的厂站内拓扑分析新方法[J]. 电工技术学报, 2011, 26(2): 187-194.
Zhang Jinfang, Wang Zengping, Zhang Yagang, Ma Jing. A Novel Method of Substation Configuration Based on Virtual Impedance. Transactions of China Electrotechnical Society, 2011, 26(2): 187-194.
2011, Vol. 26 
