Transactions of China Electrotechnical Society  2024, Vol. 39 Issue (10): 3152-3179    DOI: 10.19595/j.cnki.1000-6753.tces.230532
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A Review of the Loose Remainders Detection for Sealed Electronic Components and Devices
Li Pengfei1, Zhai Guofu1, Sun Zhigang1, Wang Guotao1,2, Zhao Xiangjiang2
1. Institute of Reliability in Electrical Apparatus and Electronics Harbin Institute of Technology Harbin 150001 China;
2. Electronic Engineering College Heilongjiang University Harbin 150080 China

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