Transactions of China Electrotechnical Society  2023, Vol. 38 Issue (18): 5061-5076    DOI: 10.19595/j.cnki.1000-6753.tces.221171
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Service States and Reliability Analysis of Residual Current Device Based on Markov Process
Li Kui1,2, Hao Yunqian1,2, Zhao Chengchen1,2, Dai Yihua1,2, Guan Ruiliang3
1. State Key Laboratory of Reliability and Intelligence of Electrical Equipment Hebei University of Technology Tianjin 300130 China;
2. Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province Hebei University of Technology Tianjin 300130 China;
3. Changshu Switchgear Manufacturer Co. Ltd Changshu 215500 China

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