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| Plasma Fluorinated Epoxy Resin and Its Insulation Properties in C4F7N/CO2 Mixed Gas |
| Zhan Zhenyu1,2, Ruan Haoou1, Lü Fangcheng1,2, Liu Wei3, Li Zhibing4, Xie Qing1,2 |
1. State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources North China Electric Power University Beijing 102206 China;
2. Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defense North China Electric Power University Baoding 071003 China;
3. State Grid Anhui Electric Power Research Institute Hefei 230022 China;
4. China Electric Science Research Institute Co. Ltd Beijing 100192 China |
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Abstract In the long-term operation of gas insulated switchgear (GIS)/gas insulated transmission line (GIL), the charge on the surface of the spacer seriously threatens the stable operation of the equipment. Improving the chemical and physical properties of the spacer surface can effectively improve its insulation performance. In this paper, the epoxy resin insulation samples were fluorinated by low temperature plasma technique. The microscopic physical and chemical compositions of the modified insulation samples were analyzed by AFM, SEM, EDS and XPS. Plasma fluorination can introduce the fluorine element on the surface of the epoxy resin efficiently and controllable. The surface roughness of the sample increases first and then decreases with the modification time. The hole energy level is slightly deeper, and the trap energy level becomes shallower first and then deeper. The AC and DC creeping flashover in the C4F7N/CO2 mixed gas reached the maximum value in the modified 10min sample. The experimental results show that the appropriate fluorination causes an increase in roughness, which leads to an increase in creepage distance, also cause a slower dissipation of positive charge and a faster dissipation of negative charge, finally increase in the flashover voltage of the sample. Excessive fluorination causes damage to the structure of the sample, and the fluorine element is peeled off, resulting in a decrease in dielectric strength.
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Received: 17 July 2019
Published: 24 April 2020
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2020, Vol. 35 
