Transactions of China Electrotechnical Society  2019, Vol. 34 Issue (6): 1310-1318    DOI: 10.19595/j.cnki.1000-6753.tces.180311
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Multi-Parameter Weibull Failure Model of PCB Insulation Reliability under Continuous Square Impulse Voltage
Zhou Quan1, Xiong Taotao1, Jiang Tianyan2, Wen Mingqian1, Ouyang Xi1
1. State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University Chongqing 400044 China;
2. School of Electrical and Electronic Engineering Chongqing University of Technology Chongqing 400054 China

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